An Electrostatic Discharge Protection Circuit Technique for the Mitigation of Single-Event Transients in SiGe BiCMOS Technology
2018 ◽
Vol 65
(1)
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pp. 426-431
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2014 ◽
Vol 61
(6)
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pp. 3210-3217
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Keyword(s):
2018 ◽
Vol 65
(1)
◽
pp. 391-398
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2021 ◽
Vol 68
(4)
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pp. 1439-1445
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