PLABEK: a complete automatic test pattern generation system for break faults in programmable logic arrays

1995 International Symposium on VLSI Technology Systems and Applications Proceedings of Technical Papers VTSA-95 ◽

10.1109/vtsa.1995.524639 ◽

2002 ◽

Author(s):

Gwo-Haur Hwang ◽

Wen-Zen Shen ◽

Shing Tenqchen

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Programmable Logic ◽

Generation System ◽

Programmable Logic Arrays ◽

Automatic Test

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Fault analysis and automatic test pattern generation for break faults in programmable logic arrays

IEE Proceedings - Circuits Devices and Systems ◽

10.1049/ip-cds:19960267 ◽

1996 ◽

Vol 143 (3) ◽

pp. 157 ◽

Cited By ~ 4

Author(s):

G.-H. Hwang ◽

W.-Z. Shen

Keyword(s):

Test Pattern ◽

Fault Analysis ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Programmable Logic ◽

Programmable Logic Arrays ◽

Automatic Test

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A distributed automatic test pattern generation system

High-Performance Computing and Networking - Lecture Notes in Computer Science ◽

10.1007/bfb0020356 ◽

2005 ◽

pp. 105-110 ◽

Cited By ~ 1

Author(s):

Peter A. Krauss

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Generation System ◽

Automatic Test

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DYNAMITE: an efficient automatic test pattern generation system for path delay faults

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.88928 ◽

1991 ◽

Vol 10 (10) ◽

pp. 1323-1335 ◽

Cited By ~ 126

Author(s):

K. Fuchs ◽

F. Fink ◽

M.H. Schulz

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Delay Faults ◽

Path Delay ◽

Path Delay Faults ◽

Generation System ◽

Automatic Test

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SOCRATES: a highly efficient automatic test pattern generation system

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.3140 ◽

1988 ◽

Vol 7 (1) ◽

pp. 126-137 ◽

Cited By ~ 383

Author(s):

M.H. Schulz ◽

E. Trischler ◽

T.M. Sarfert

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Generation System ◽

Automatic Test ◽

Highly Efficient

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Results of a topologically partitioned parallel automatic test pattern generation system on a distributed-memory multiprocessor

[1992] Proceedings. Fifth Annual IEEE International ASIC Conference and Exhibit ◽

10.1109/asic.1992.270264 ◽

2003 ◽

Cited By ~ 3

Author(s):

R.H. Bell ◽

R.H. Klenke ◽

J.H. Aylor ◽

R.D. Williams

Keyword(s):

Distributed Memory ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Generation System ◽

Automatic Test

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LDS-ATPG: an automatic test pattern generation system for combinational VLSI circuits

10.1109/vtsa.1989.68604 ◽

2003 ◽

Author(s):

Sen-Chung Jiang ◽

Chung Len Lee ◽

Wen-Zen Shen ◽

J.-E. Chen ◽

Ching-Ping Wu

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Vlsi Circuits ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Generation System ◽

Automatic Test

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An Integrated Design for Testability and Automatic Test Pattern Generation System: An Overview

21st Design Automation Conference Proceedings ◽

10.1109/dac.1984.1585796 ◽

1984 ◽

Cited By ~ 3

Author(s):

E. Trischler

Keyword(s):

Test Pattern ◽

Integrated Design ◽

Design For Testability ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Generation System ◽

Automatic Test

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An automatic test pattern generation framework for combinational threshold logic networks

IEEE International Conference on Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. ◽

10.1109/iccd.2004.1347974 ◽

2004 ◽

Cited By ~ 6

Author(s):

P. Gupta ◽

Rui Zhang ◽

N.K. Jha

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Threshold Logic ◽

Automatic Test

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Automatic test pattern generation can be solved as a constraint satisfaction problem

Microprocessing and Microprogramming ◽

10.1016/0165-6074(93)90216-8 ◽

1993 ◽

Vol 38 (1-5) ◽

pp. 715-722

Author(s):

K. Tilly ◽

L. Surján ◽

G. Román

Keyword(s):

Constraint Satisfaction ◽

Test Pattern ◽

Constraint Satisfaction Problem ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Automatic Test

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Automatic Test Pattern Generation for Multiple Missing Gate Faults in Reversible Circuits

Reversible Computation - Lecture Notes in Computer Science ◽

10.1007/978-3-319-59936-6_14 ◽

2017 ◽

pp. 176-182 ◽

Cited By ~ 2

Author(s):

Anmol Prakash Surhonne ◽

Anupam Chattopadhyay ◽

Robert Wille

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Automatic Test ◽

Reversible Circuits

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