LDS-ATPG: an automatic test pattern generation system for combinational VLSI circuits

2003 ◽  
Author(s):  
Sen-Chung Jiang ◽  
Chung Len Lee ◽  
Wen-Zen Shen ◽  
J.-E. Chen ◽  
Ching-Ping Wu
Keyword(s):  
Test Pattern ◽  
Pattern Generation ◽  
Vlsi Circuits ◽  
Test Pattern Generation ◽  
Automatic Test Pattern Generation ◽  
Generation System ◽  
Automatic Test

scholarly journals Soft Computing Approach To Automatic Test Pattern Generation For Sequential Vlsi Circuit

2013 ◽  
pp. 42-47
Author(s):  
Monalisa Mohanty ◽  
S. N. Patnaik
Keyword(s):  
Integrated Circuits ◽  
Test Pattern ◽  
Difficult Problem ◽  
Pattern Generation ◽  
Vlsi Circuits ◽  
Test Sequence ◽  
Test Pattern Generation ◽  
Automatic Test Pattern Generation ◽  
Automatic Test ◽  
Sequence Generation

Due to the constant development in the integrated circuits, the automatic test pattern generation problem become more vital for sequential vlsi circuits in these days. Also testing of integrating circuits and systems has become a difficult problem. In this paper we have discussed the problem of the automatic test sequence generation using particle swarm optimization(PSO) and technique for structure optimization of a deterministic test pattern generator using genetic algorithm(GA).

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