High Speed and Sensitive X-ray Analysis System with Automated Aberration Correction Scanning Transmission Electron Microscope

Applied Microscopy ◽

10.9729/am.2015.45.1.1 ◽

2015 ◽

Vol 45 (1) ◽

pp. 1-8 ◽

Author(s):

Hiromi Inada ◽

Yoichi Hirayama ◽

Keiji Tamura ◽

Daisuke Terauchi ◽

Ryoji Namekawa ◽

...

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

Aberration Correction ◽

X Ray ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Analysis System

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X-ray mapping in a scanning transmission electron microscope of InGaAs quantum dots with embedded fractional monolayers of Al

10.22443/rms.emc2020.1436 ◽

2021 ◽

Author(s):

Thomas Walther ◽

Keyword(s):

Quantum Dots ◽

Electron Microscope ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

X Ray ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission

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Limitations in the X-ray microanalysis of thin foils in a scanning transmission electron microscope

Journal of Microscopy ◽

10.1111/j.1365-2818.1977.tb00021.x ◽

1977 ◽

Vol 110 (2) ◽

pp. 107-112 ◽

Author(s):

P. Doig ◽

P. E. J. Flewitt

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

X Ray ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission

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Energy dispersive X-ray spectroscopy of bimetallic nanoparticles in an aberration corrected scanning transmission electron microscope

Faraday Discussions ◽

10.1039/b706293c ◽

2008 ◽

Vol 138 ◽

pp. 337-351 ◽

Author(s):

Andrew A. Herzing ◽

Masashi Watanabe ◽

Jennifer K. Edwards ◽

Marco Conte ◽

Zi-Rong Tang ◽

...

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Bimetallic Nanoparticles ◽

Scanning Transmission Electron Microscope ◽

Energy Dispersive ◽

X Ray ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Aberration Corrected

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Analytical Electron Microscopy: X-Ray Microanalysis Using the Scanning Transmission Electron Microscope

Electron and Positron Spectroscopies in Materials Science and Engineering ◽

10.1016/b978-0-12-139150-8.50015-4 ◽

1979 ◽

pp. 315-334 ◽

Author(s):

DAVID R. CLARKE

Keyword(s):

Electron Microscopy ◽

Electron Microscope ◽

Transmission Electron Microscope ◽

Analytical Electron Microscopy ◽

Scanning Transmission Electron Microscope ◽

X Ray ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Analytical Electron ◽

Scanning Transmission

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Comment on ‘The spatial resolution of X-ray microanalysis in the scanning transmission electron microscope’

Philosophical Magazine A ◽

10.1080/01418618108235820 ◽

1981 ◽

Vol 44 (6) ◽

pp. 1401-1405 ◽

Author(s):

I. P. Jones

Keyword(s):

Electron Microscope ◽

Spatial Resolution ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

X Ray ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission

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Spherical aberration correction in a scanning transmission electron microscope using a sculpted thin film

Ultramicroscopy ◽

10.1016/j.ultramic.2018.03.016 ◽

2018 ◽

Vol 189 ◽

pp. 46-53 ◽

Author(s):

Roy Shiloh ◽

Roei Remez ◽

Peng-Han Lu ◽

Lei Jin ◽

Yossi Lereah ◽

...

Keyword(s):

Thin Film ◽

Electron Microscope ◽

Transmission Electron Microscope ◽

Spherical Aberration ◽

Scanning Transmission Electron Microscope ◽

Aberration Correction ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission

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Corrigendum to “Spherical aberration correction in a scanning transmission electron microscope using a sculpted thin film” [Ultramicroscopy 189 (2018) 46–53]

Ultramicroscopy ◽

10.1016/j.ultramic.2020.112965 ◽

2020 ◽

Vol 216 ◽

pp. 112965

Author(s):

Roy Shiloh ◽

Roei Remez ◽

Peng-Han Lu ◽

Lei Jin ◽

Yossi Lereah ◽

...

Keyword(s):

Thin Film ◽

Electron Microscope ◽

Transmission Electron Microscope ◽

Spherical Aberration ◽

Scanning Transmission Electron Microscope ◽

Aberration Correction ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission

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A high-speed area detector for novel imaging techniques in a scanning transmission electron microscope

Ultramicroscopy ◽

10.1016/j.ultramic.2008.11.023 ◽

2009 ◽

Vol 109 (4) ◽

pp. 304-311 ◽

Author(s):

T.A. Caswell ◽

P. Ercius ◽

M.W. Tate ◽

A. Ercan ◽

S.M. Gruner ◽

...

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Imaging Techniques ◽

Scanning Transmission Electron Microscope ◽

Area Detector ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission

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Highly spatially resolved X-ray analysis of semiconductor alloys and nanostructures in a scanning transmission electron microscope

Philosophical Magazine A ◽

10.1080/01418619608240733 ◽

1996 ◽

Vol 74 (6) ◽

pp. 1421-1437 ◽

Author(s):

U. Bangert ◽

A. J. Harvey ◽

C. Diekek ◽

A. Hartmann ◽

R. Keyse

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

Semiconductor Alloys ◽

X Ray ◽

Scanning Transmission Electron ◽

Spatially Resolved ◽

Transmission Electron ◽

Scanning Transmission

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Recording transmitted beam current for X-ray microanalysis in a scanning transmission electron microscope

Journal of Microscopy ◽

10.1111/j.1365-2818.1980.tb04137.x ◽

1980 ◽

Vol 120 (2) ◽

pp. 207-211 ◽

Author(s):

A. T. Marshall

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Beam Current ◽

Scanning Transmission Electron Microscope ◽

Transmitted Beam ◽

X Ray ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission

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