In situ observation of crystallization of mold slag using a digital optical microscope in an infrared furnace

2018 ◽  
Author(s):  
Lilong Zhu ◽  
Qian Wang ◽  
Qiangqiang Wang ◽  
Shaoda Zhang ◽  
Shengping He
Keyword(s):  
Optical Microscope ◽  
In Situ Observation ◽  
Mold Slag

scholarly journals In-situ observation of graphene using an optical microscope

2021 ◽  
Vol 6 ◽  
pp. 100138
Author(s):  
Mikihiro Kato ◽  
Sujun Guan ◽  
Xinwei Zhao
Keyword(s):  
Optical Microscope ◽  
In Situ Observation

Microscopic Observations of SOFC Anodes Under Operation With Hydrocarbon Fuels

2004 ◽  
Author(s):  
Tatsuya Kawada ◽  
Keiji Yashiro ◽  
Tomoaki Taura ◽  
Kenichiro Takeda ◽  
Atsushi Kaimai ◽  
...  
Keyword(s):  
Elevated Temperatures ◽  
Carbon Deposition ◽  
Optical Microscope ◽  
Open Circuit ◽  
In Situ Observation ◽  
Nickel Surface ◽  
Operation Condition ◽  
Grid Electrode ◽  
Laser Raman

Carbon deposition on a SOFC anode was investigated under direct hydrocarbon fueling condition. Microscopic behaviors were observed with a newly designed sample holder that enabled in-situ observation of an electrode in operation under controlled atmosphere at elevated temperatures. The preferential carbon deposition site, the structure of the deposited carbon, and the chemical or electrochemical re-oxidation processes were investigated with an optical microscope combined with a laser Raman microscope. Color and morphology change of the electrode surface was recorded with a CCD camera, and the deposited materials were identified with a laser Raman microscope. A nickel micro grid was used as a model electrode of a well-defined microstructure. When the cell was kept at an open circuit condition in methane, carbon started to deposit on the surface of Ni grid electrode. The deposition of carbon was clearly observed as the change in the reflection on the nickel surface by optical microscope as well as by the appearance of the specific peak at ∼ 1560 cm−1 in Raman spectroscopy. The deposited carbon was in the form of graphite on the nickel grid electrode. The carbon coverage on the surface was not uniform but varied from grain to grain. When a certain anodic overpotential (e.g. 200 mV) was applied to the electrode, the carbon disappeared gradually from the edge of the electrode i.e. from the electrode/electrolyte boundary where oxygen was supplied electrochemically. It is the first in-situ observation of the electrochemical carbon oxidation in a real operation condition.

scholarly journals Very Low Nucleation Rates of Glucose Isomerase Crystals under Microgravity in the International Space Station

Crystals ◽  
2019 ◽  
Vol 9 (2) ◽  
pp. 90
Author(s):  
Yoshihisa Suzuki ◽  
Takahisa Fujiwara ◽  
Katsuo Tsukamoto ◽  
Seijiro Fukuyama ◽  
Taro Shimaoka ◽  
...  
Keyword(s):  
International Space Station ◽  
Growth Rates ◽  
Space Station ◽  
Glucose Isomerase ◽  
Optical Microscope ◽  
In Situ Observation ◽  
International Space ◽  
High Supersaturation ◽  
Very High

In situ observation of the nucleation and growth of glucose isomerase (GI) crystals under microgravity was conducted using an optical microscope during the first flight of the Advanced Nano Step project undertaken in the International Space Station (ISS). Very low apparent nucleation rates (J’) of GI crystals in the solution and on the substrate of the growth container were confirmed compared with those on the ground. In particular, J’ of GI crystals in the solution were a few times lower than that on the substrate. The growth rates (R) of the {101} faces of GI crystals on the substrate and the apparent growth rates (R’) in the solution were measured. The very low nucleation rates allowed us to successfully measure R at a very high supersaturation region (up to ln(C/Ce) = 6), at which R cannot be measured on the ground.

scholarly journals In-situ study of electrochemical migration of tin in the presence of bromide ion

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Ee Lynn Lee ◽  
A. S. M. A. Haseeb ◽  
Wan Jeffrey Basirun ◽  
Yew Hoong Wong ◽  
Mohd Faizul Mohd Sabri ◽  
...  
Keyword(s):  
Water Drop ◽  
Short Circuit ◽  
Optical Microscope ◽  
In Situ Observation ◽  
Electrochemical Migration ◽  
X Rays ◽  
Corrosion Properties ◽  
Bromide Ion ◽  
Ionic Contaminants

AbstractThe miniaturization of electronic devices and the consequent decrease in the distance between conductive lines have increased the risk of short circuit failure due to electrochemical migration (ECM). The presence of ionic contaminants affects the ECM process. This work systematically investigates the ECM of tin (Sn) in the presence of bromide ions (Br−) in the range of 10−6 M to 1.0 M. Water drop test (WDT) was conducted in the two-probe semiconductor characterization system under an optical microscope as an in-situ observation. Polarization test was carried out to study the correlation between the corrosion properties of Sn and its ECM behaviour. The products of ECM were characterized by scanning electron microscope coupled with an energy dispersive X-rays spectrometer (SEM/EDX) and X-ray photoelectron spectrometer (XPS). The results confirm that the rate of anodic dissolution of Sn monotonously increases with the Br− concentration. However, the probability of ECM failure follows a normal distribution initially, but later increases with the Br− concentration. The main products of the ECM reactions are identified as Sn dendrites and tin hydroxide precipitates. The mechanisms of the ECM process of Sn in the presence of Br− are also suggested.

scholarly journals Development of Double and Single Hot Thermocouple Technique for in Situ Observation and Measurement of Mold Slag Crystallization.

1998 ◽  
Vol 38 (4) ◽  
pp. 348-356 ◽  
Author(s):  
Yoshiaki Kashiwaya ◽  
Carlos E. Cicutti ◽  
Alan W. Cramb ◽  
Kuniyoshi Ishii
Keyword(s):  
In Situ Observation ◽  
Mold Slag ◽  
Single Hot Thermocouple Technique

The Determination of Solution Temperature for NCu30-4-2-1 Alloy

2014 ◽  
Vol 1061-1062 ◽  
pp. 45-48
Author(s):  
Si Qi Huang ◽  
Yun Long Ai ◽  
Wen He ◽  
Xiao Rui Shen
Keyword(s):  
Heat Treatment ◽  
High Temperature ◽  
Optical Microscope ◽  
Solution Temperature ◽  
Heating Process ◽  
In Situ Observation ◽  
Strengthening Phase ◽  
Optimum Solution

NCu30-4-2-1 alloy was treated by the two methods of in situ observation experiment at high temperature and common heat treatment to determine solution temperature. High temperature metallurgical microscope was used to in situ observation of microstructure evolution of NCu30-4-2-1 alloy during heating process. The microstructures of the samples were observed by optical microscope. The results show that the as-cast microstructure of NCu30-4-2-1 alloy is composed by dendritic α-Ni-based solid solution and net-like (α+β) eutectics. The morphology of strengthening phase β-Ni3Si is graininess distributing on the grain boundary. The optimum solution temperature is both determined as 950°C by the two methods. The two methods of in situ observation experiment at high temperature and common heat treatment have comparability.

AC ELECTRIC-FIELD-INDUCED ORIENTATION OF POLAR ORGANIC NANOCRYSTAL IN DISPERSE SYSTEM

2002 ◽  
Vol 01 (05n06) ◽  
pp. 737-741 ◽  
Author(s):  
T. ONODERA ◽  
M. YOSHIDA ◽  
S. OKAZOE ◽  
S. FUJITA ◽  
H. KASAI ◽  
...  
Keyword(s):  
Dipole Moment ◽  
Electric Field ◽  
Optical Microscope ◽  
In Situ Observation ◽  
Ac Electric Field ◽  
Dc Electric Field ◽  
Reprecipitation Method ◽  
Orientational Motion ◽  
Display Monitor

Monodispersed DAST nanocrystals have almost been successfully fabricated by means of the inverse reprecipitation method. By employing AC electric field, high electric field of above ca. 1.0 kVcm -1 could be applied to polar DAST nanocrystals dispersed in decahydronaphthalene, so as to avoid electrophoresis of nanocrystals under DC electric field. The response of DAST nanocrystal dispersion to applied AC electric field was analyzed phenomenologically by fitting Langevin function, which provided a large permanent dipole moment of DAST nanocrystal. In addition, we have succeeded in in situ observation of AC electric-field-induced orientational motion of DAST crystals by using an optical microscope. The present DAST nanocrystal dispersion system will be expected as an optical device like display monitor.

scholarly journals In Situ Observation of Aluminothermic Reduction of MgO with High Temperature Optical Microscope

2006 ◽  
Vol 46 (2) ◽  
pp. 202-209 ◽  
Author(s):  
Jian Yang ◽  
Mamoru Kuwabara ◽  
Zhongzhu Liu ◽  
Takashi Asano ◽  
Masamichi Sano
Keyword(s):  
High Temperature ◽  
Optical Microscope ◽  
Aluminothermic Reduction ◽  
In Situ Observation

In Situ Observation of Catalyzed Gasification of Graphite by Nickel

1981 ◽  
Vol 39 ◽  
pp. 76-77
Author(s):  
R. T. K. Baker ◽  
R. D. Sherwood
Keyword(s):  
Objective Lens ◽  
In Situ Observation ◽  
Gas Flows ◽  
Catalytic Gasification ◽  
Television Camera ◽  
Viewing Screen ◽  
Fuels And Chemicals ◽  
Gasification Of Carbon ◽  
Transmission Microscope

The catalytic gasification of carbon at high temperature by microscopic size metal particles is of fundamental importance to removal of coke deposits and conversion of refractory hydrocarbons into fuels and chemicals. The reaction of metal/carbon/gas systems can be observed by controlled atmosphere electron microscopy (CAEM) in an 100 KV conventional transmission microscope. In the JEOL gas reaction stage model AGl (Fig. 1) the specimen is positioned over a hole, 200μm diameter, in a platinum heater strip, and is interposed between two apertures, 75μm diameter. The control gas flows across the specimen and exits through these apertures into the specimen chamber. The gas is further confined by two apertures, one in the condenser and one in the objective lens pole pieces, and removed by an auxiliary vacuum pump. The reaction zone is <1 mm thick and is maintained at gas pressure up to 400 Torr and temperature up to 1300<C as measured by a Pt-Pt/Rh 13% thermocouple. Reaction events are observed and recorded on videotape by using a Philips phosphor-television camera located below a hole in the center of the viewing screen. The overall resolution is greater than 2.5 nm.

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