scholarly journals In-situ study of electrochemical migration of tin in the presence of bromide ion

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Ee Lynn Lee ◽  
A. S. M. A. Haseeb ◽  
Wan Jeffrey Basirun ◽  
Yew Hoong Wong ◽  
Mohd Faizul Mohd Sabri ◽  
...  
Keyword(s):  
Water Drop ◽  
Short Circuit ◽  
Optical Microscope ◽  
In Situ Observation ◽  
Electrochemical Migration ◽  
X Rays ◽  
Corrosion Properties ◽  
Bromide Ion ◽  
Ionic Contaminants

AbstractThe miniaturization of electronic devices and the consequent decrease in the distance between conductive lines have increased the risk of short circuit failure due to electrochemical migration (ECM). The presence of ionic contaminants affects the ECM process. This work systematically investigates the ECM of tin (Sn) in the presence of bromide ions (Br−) in the range of 10−6 M to 1.0 M. Water drop test (WDT) was conducted in the two-probe semiconductor characterization system under an optical microscope as an in-situ observation. Polarization test was carried out to study the correlation between the corrosion properties of Sn and its ECM behaviour. The products of ECM were characterized by scanning electron microscope coupled with an energy dispersive X-rays spectrometer (SEM/EDX) and X-ray photoelectron spectrometer (XPS). The results confirm that the rate of anodic dissolution of Sn monotonously increases with the Br− concentration. However, the probability of ECM failure follows a normal distribution initially, but later increases with the Br− concentration. The main products of the ECM reactions are identified as Sn dendrites and tin hydroxide precipitates. The mechanisms of the ECM process of Sn in the presence of Br− are also suggested.

scholarly journals In-Situ Study of Electrochemical Migration of Tin in The Presence of Bromide Ion

2020 ◽  
Author(s):  
Ee Lynn Lee ◽  
A. S. M. A. Haseeb ◽  
Wan Jeffrey Basirun ◽  
Yew Hoong Wong ◽  
Mohd Faizul Mohd Sabri ◽  
...  
Keyword(s):  
Water Drop ◽  
Short Circuit ◽  
Optical Microscope ◽  
Electrochemical Migration ◽  
X Rays ◽  
Corrosion Properties ◽  
Bromide Ion ◽  
Water Drop Test ◽  
Ionic Contaminants

Abstract The miniaturization of electronic devices and the consequent decrease in the distance between conductive lines have increased the risk of short circuit failure due to electrochemical migration (ECM). The presence of ionic contaminants in the devices can accelerate the ECM process. This work systematically investigates the ECM of tin (Sn) in the presence of bromide ions (Br−) in the range of 10-6 M to 1.0 M. Water drop test (WDT) was conducted in the two-probe semiconductor characterization system under an optical microscope for in-situ observations. Anodic polarization test (APT) was carried out to study the correlation between corrosion properties of Sn and its ECM behaviour. The products of ECM were characterized by scanning electron microscope coupled with an energy dispersive X-rays spectrometer (SEM/ EDX) and X-ray photoelectron spectrometer (XPS). The results confirm that the rate of anodic dissolution of Sn monotonously increases with Br− concentration. However, the probability of ECM failure follows a normal distribution initially, but later increases with the Br− concentration. The main products of the ECM reactions are identified as Sn dendrites and tin hydroxide precipitates. The mechanism of the ECM process of Sn in the presence of Br− is also suggested.

scholarly journals In-situ observation of graphene using an optical microscope

2021 ◽  
Vol 6 ◽  
pp. 100138
Author(s):  
Mikihiro Kato ◽  
Sujun Guan ◽  
Xinwei Zhao
Keyword(s):  
Optical Microscope ◽  
In Situ Observation

scholarly journals A zone melting device for the in situ observation of directional solidification using high-energy synchrotron x rays

2020 ◽  
Vol 91 (9) ◽  
pp. 093901
Author(s):  
C. Gombola ◽  
G. Hasemann ◽  
A. Kauffmann ◽  
I. Sprenger ◽  
S. Laube ◽  
...  
Keyword(s):  
Directional Solidification ◽  
High Energy ◽  
Zone Melting ◽  
In Situ Observation ◽  
X Rays

Microscopic Observations of SOFC Anodes Under Operation With Hydrocarbon Fuels

2004 ◽  
Author(s):  
Tatsuya Kawada ◽  
Keiji Yashiro ◽  
Tomoaki Taura ◽  
Kenichiro Takeda ◽  
Atsushi Kaimai ◽  
...  
Keyword(s):  
Elevated Temperatures ◽  
Carbon Deposition ◽  
Optical Microscope ◽  
Open Circuit ◽  
In Situ Observation ◽  
Nickel Surface ◽  
Operation Condition ◽  
Grid Electrode ◽  
Laser Raman

Carbon deposition on a SOFC anode was investigated under direct hydrocarbon fueling condition. Microscopic behaviors were observed with a newly designed sample holder that enabled in-situ observation of an electrode in operation under controlled atmosphere at elevated temperatures. The preferential carbon deposition site, the structure of the deposited carbon, and the chemical or electrochemical re-oxidation processes were investigated with an optical microscope combined with a laser Raman microscope. Color and morphology change of the electrode surface was recorded with a CCD camera, and the deposited materials were identified with a laser Raman microscope. A nickel micro grid was used as a model electrode of a well-defined microstructure. When the cell was kept at an open circuit condition in methane, carbon started to deposit on the surface of Ni grid electrode. The deposition of carbon was clearly observed as the change in the reflection on the nickel surface by optical microscope as well as by the appearance of the specific peak at ∼ 1560 cm−1 in Raman spectroscopy. The deposited carbon was in the form of graphite on the nickel grid electrode. The carbon coverage on the surface was not uniform but varied from grain to grain. When a certain anodic overpotential (e.g. 200 mV) was applied to the electrode, the carbon disappeared gradually from the edge of the electrode i.e. from the electrode/electrolyte boundary where oxygen was supplied electrochemically. It is the first in-situ observation of the electrochemical carbon oxidation in a real operation condition.

scholarly journals Very Low Nucleation Rates of Glucose Isomerase Crystals under Microgravity in the International Space Station

Crystals ◽  
2019 ◽  
Vol 9 (2) ◽  
pp. 90
Author(s):  
Yoshihisa Suzuki ◽  
Takahisa Fujiwara ◽  
Katsuo Tsukamoto ◽  
Seijiro Fukuyama ◽  
Taro Shimaoka ◽  
...  
Keyword(s):  
International Space Station ◽  
Growth Rates ◽  
Space Station ◽  
Glucose Isomerase ◽  
Optical Microscope ◽  
In Situ Observation ◽  
International Space ◽  
High Supersaturation ◽  
Very High

In situ observation of the nucleation and growth of glucose isomerase (GI) crystals under microgravity was conducted using an optical microscope during the first flight of the Advanced Nano Step project undertaken in the International Space Station (ISS). Very low apparent nucleation rates (J’) of GI crystals in the solution and on the substrate of the growth container were confirmed compared with those on the ground. In particular, J’ of GI crystals in the solution were a few times lower than that on the substrate. The growth rates (R) of the {101} faces of GI crystals on the substrate and the apparent growth rates (R’) in the solution were measured. The very low nucleation rates allowed us to successfully measure R at a very high supersaturation region (up to ln(C/Ce) = 6), at which R cannot be measured on the ground.

scholarly journals In Situ Observation of the Four-step Dehydration Process of the 1β-Methylcarbapenem Antibiotic CS-834 Crystal by X-Rays

2003 ◽  
Vol 51 (12) ◽  
pp. 1356-1362 ◽  
Author(s):  
Katsuhiro Kobayashi ◽  
Hiroshi Fukuhara ◽  
Tadashi Hata ◽  
Yuji Ohashi
Keyword(s):  
In Situ Observation ◽  
X Rays ◽  
Dehydration Process
Sign in / Sign up

Export Citation Format

Share Document