Parametrization of optical properties of indium–tin–oxide thin films by spectroscopic ellipsometry: Substrate interfacial reactivity

2002 ◽  
Vol 20 (1) ◽  
pp. 37-42 ◽  
Author(s):  
M. Losurdo ◽  
M. Giangregorio ◽  
P. Capezzuto ◽  
G. Bruno ◽  
R. De Rosa ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Tin Oxide ◽  
Spectroscopic Ellipsometry ◽  
Indium Tin Oxide ◽  
Oxide Thin Films ◽  
Interfacial Reactivity

Application of Spectroscopic Ellipsometry for the Study of Electrical and Optical Properties of Indium Tin Oxide Thin Films

2014 ◽  
Vol 34 (10) ◽  
pp. 1031003
Author(s):  
胡慧 Hu Hui ◽  
张丽平 Zhang Liping ◽  
孟凡英 Meng Fanying ◽  
刘正新 Liu Zhengxin
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Tin Oxide ◽  
Spectroscopic Ellipsometry ◽  
Indium Tin Oxide ◽  
Oxide Thin Films ◽  
Electrical And Optical Properties

Improving the Morphological and Optical Properties of Sputtered Indium Tin Oxide Thin Films by Adopting Ultralow-Pressure Sputtering

2009 ◽  
Vol 156 (1) ◽  
pp. J6 ◽  
Author(s):  
Myung Soo Huh ◽  
Bong Seop Yang ◽  
Jaewon Song ◽  
Jaeyeong Heo ◽  
Seok-Jun Won ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Oxide Thin Films

Optical Properties of Sputtered Indium-tin-oxide Thin Films

2011 ◽  
Vol 59 (5(1)) ◽  
pp. 3280-3283 ◽  
Author(s):  
Manil Kang ◽  
Inkoo Kim ◽  
Minwoo Chu ◽  
Sok Won Kim ◽  
Ji-Wook Ryu
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Oxide Thin Films
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