Application of Spectroscopic Ellipsometry for the Study of Electrical and Optical Properties of Indium Tin Oxide Thin Films

2014 ◽  
Vol 34 (10) ◽  
pp. 1031003
Author(s):  
胡慧 Hu Hui ◽  
张丽平 Zhang Liping ◽  
孟凡英 Meng Fanying ◽  
刘正新 Liu Zhengxin
Sign in / Sign up

Export Citation Format

Share Document