Surface and interface characterization of GaN/AlGaN high electron mobility transistor structures by x-ray and atomic force microscopy

2002 ◽  
Vol 20 (3) ◽  
pp. 1234 ◽  
Author(s):  
A. Torabi ◽  
P. Ericson ◽  
E. J. Yarranton ◽  
W. E. Hoke
Keyword(s):  
Atomic Force Microscopy ◽  
High Electron Mobility Transistor ◽  
High Electron ◽  
High Electron Mobility ◽  
X Ray ◽  
Force Microscopy ◽  
Interface Characterization ◽  
Surface And Interface ◽  
Atomic Force

Surface and Interface Characterization of Asphaltenic Fractions Obtained with Different Alkanes: A Study by Atomic Force Microscopy and Pendant Drop Tensiometry

2018 ◽  
Vol 32 (12) ◽  
pp. 12174-12186 ◽  
Author(s):  
Iago Oliveira ◽  
Larissa Gomes ◽  
Elton Franceschi ◽  
Gustavo Borges ◽  
Juliana F. de Conto ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Pendant Drop ◽  
Force Microscopy ◽  
Interface Characterization ◽  
Surface And Interface ◽  
Atomic Force

Hard High Density Carbon Thin Films for X-Ray Multilayer Optics

1994 ◽  
Vol 349 ◽  
Author(s):  
Joseph Pedulla ◽  
Axel Bartos ◽  
Richard D. Deslattes
Keyword(s):  
Ion Beam ◽  
High Hardness ◽  
Carbon Films ◽  
High Electron ◽  
Optical Elements ◽  
X Ray ◽  
Force Microscopy ◽  
Surface And Interface ◽  
Atomic Force ◽  
High Uniformity

ABSTRACTDual ion beam assisted deposition (DIBAD) techniques are known to produce high quality diamond-like carbon films. The reported extreme hardness and high thermal conductivity characteristics of these films have stimulated our investigation of their use as one component of multilayer x-ray optical elements. Non-crystalline carbon films were produced and were characterized by means of highly collimated x-ray refiectometry (λ = 0.154 nn), atomic force microscopy, and IR Raman spectroscopy techniques. They exhibit extreme smoothness at the surface and interface, near diamond density, high hardness, and high uniformity over areas of 0.58 x 10-4 m2. Multilayers have been constructed of this non-crystalline carbon interposed with high electron density materials that have exhibited very good x-ray and EUV optical characteristics at λ = 0.154 nm and at λ = 4.0 – 8.0 nm.

Structural characterization of dimercury(1+) pentacyanonitrosylferrate(2−), Hg2[Fe(CN)5NO]

2000 ◽  
Vol 15 (3) ◽  
pp. 193-197
Author(s):  
V. Venegas ◽  
G. Rueda-Morales ◽  
E. Reguera ◽  
F. Caleyo
Keyword(s):  
Atomic Force Microscopy ◽  
Orthorhombic Symmetry ◽  
Unit Cell Parameters ◽  
Calculated Density ◽  
X Ray ◽  
Cell Parameters ◽  
Force Microscopy ◽  
Atomic Force ◽  
Density Values

The titled compound, Hg2[Fe(CN)5NO], was synthesized and studied by X-ray powder diffraction, infrared spectroscopy, Mössbauer spectroscopy, and atomic force microscopy. The results arising from this study indicate that this compound is anhydrous and crystallizes in the P222 orthorhombic symmetry. The unit cell parameters were quantified as a=16.5905(9) Å, b=12.3145(8) Å, and c=8.7576(5) Å. The measured and calculated density values are Dm=1.149 g/cm3 and Dc=1.145 g/cm3, respectively, with Z=2.

Characterization of kaolinite in the hardsetting clay fraction using atomic force microscopy, X-ray diffraction, and the Rietveld method

2017 ◽  
Vol 17 (8) ◽  
pp. 2144-2155 ◽  
Author(s):  
Luis Valério Prandel ◽  
Nívea Maria Piccolomini Dias ◽  
Sérgio da Costa Saab ◽  
André Maurício Brinatti ◽  
Neyde Fabíola Balarezo Giarola ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Rietveld Method ◽  
Clay Fraction ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

Integrated atomic force microscopy and x-ray irradiation for in situ characterization of radiation-induced processes

2021 ◽  
Vol 92 (11) ◽  
pp. 113701
Author(s):  
Shawn L. Riechers ◽  
Nikolai Petrik ◽  
John S. Loring ◽  
Mark K. Murphy ◽  
Carolyn I. Pearce ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
In Situ Characterization ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Radiation Induced
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