Ion beams in SEM: An experiment towards a high brightness low energy spread electron impact gas ion source

Author(s):  
David S. Jun ◽  
Vladimir G. Kutchoukov ◽  
Pieter Kruit
Author(s):  
Adam V. Steele ◽  
Brenton Knuffman ◽  
Jabez J. McClelland

Abstract We present a review of the Low Temperature Ion Source (LoTIS): its aims, design, performance data collected to date, and focused spot size projections when integrated with a FIB. LoTIS provides a Cs+ beam that has been measured to have high brightness (> 107Am-2sr-1eV-1), and low-energy spread (< 0.5 eV). These source characteristics enable a prediction of subnm focused spot sizes. A FIB with the capabilities enabled by LoTIS would be well-suited to addressing FIB failure analysis tasks such as nanomachining, circuit edit, and site-specific SIMS.


1995 ◽  
Vol 13 (6) ◽  
pp. 2836-2842 ◽  
Author(s):  
Y.‐W. Kim ◽  
I. Petrov ◽  
H. Ito ◽  
J. E. Greene

1971 ◽  
Vol 42 (3) ◽  
pp. 354-355 ◽  
Author(s):  
M. Steinberg ◽  
B. Yap ◽  
H. H. Fleischmann
Keyword(s):  

1969 ◽  
Vol 40 (1) ◽  
pp. 102-105 ◽  
Author(s):  
Michael Menzinger ◽  
Lars Wåhlin

1999 ◽  
Vol 46 (1-4) ◽  
pp. 477-480 ◽  
Author(s):  
W.H. Bruenger ◽  
M. Torkler ◽  
K.N. Leung ◽  
Y. Lee ◽  
M.D. Williams ◽  
...  

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