Molecular beam epitaxy growth of thin films of SnS2 and SnSe2 on cleaved mica and the basal planes of single‐crystal layered semiconductors: Reflection high‐energy electron diffraction, low‐energy electron diffraction, photoemission, and scanning tunneling microscopy/atomic force microscopy characterization
1995 ◽
Vol 13
(3)
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pp. 1761-1767
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2000 ◽
Vol 18
(3)
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pp. 1198
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1999 ◽
Vol 30
(4-5)
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pp. 449-453
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2014 ◽
Vol 10
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pp. 2055-2064
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2006 ◽
Vol 38
(12-13)
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pp. 1611-1614
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2010 ◽
Vol 5
(12)
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pp. 1935-1941
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