scholarly journals Nitrogen incorporation and trace element analysis of nanocrystalline diamond thin films by secondary ion mass spectrometry

1999 ◽  
Vol 17 (4) ◽  
pp. 1135-1140 ◽  
Author(s):  
D. Zhou ◽  
F. A. Stevie ◽  
L. Chow ◽  
J. McKinley ◽  
H. Gnaser ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Thin Films ◽  
Trace Element ◽  
Secondary Ion Mass Spectrometry ◽  
Trace Element Analysis ◽  
Nanocrystalline Diamond ◽  
Element Analysis ◽  
Nitrogen Incorporation ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Quantitative trace element analysis of microdroplet residues by secondary-ion mass spectrometry

1988 ◽  
Vol 60 (19) ◽  
pp. 2070-2075 ◽  
Author(s):  
Robert W. Odom ◽  
Gayle. Lux ◽  
Ronald H. Fleming ◽  
Paul K. Chu ◽  
Ilsabe C. Niemeyer ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Trace Element ◽  
Secondary Ion Mass Spectrometry ◽  
Trace Element Analysis ◽  
Element Analysis ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

An investigation of cobalt oxide based nanocrystalline thin films by secondary ion mass spectrometry

2001 ◽  
Vol 15 (17) ◽  
pp. 1621-1624 ◽  
Author(s):  
Simona Barison ◽  
Davide Barreca ◽  
Sergio Daolio ◽  
Monica Fabrizio ◽  
Eugenio Tondello
Keyword(s):  
Mass Spectrometry ◽  
Thin Films ◽  
Cobalt Oxide ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Nanocrystalline Thin Films
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