Stoichiometry controlled homogeneous ternary oxide growth in showerhead atomic layer deposition reactor and application for ZrxHf1−xO2

2021 ◽  
Vol 39 (3) ◽  
pp. 030401
Author(s):  
Triratna Muneshwar ◽  
Doug Barlage ◽  
Ken Cadien
2017 ◽  
Vol 122 (21) ◽  
pp. 215302 ◽  
Author(s):  
Pei-Yu Chen ◽  
Agham B. Posadas ◽  
Sunah Kwon ◽  
Qingxiao Wang ◽  
Moon J. Kim ◽  
...  

2002 ◽  
Vol 745 ◽  
Author(s):  
Martin M. Frank ◽  
Yves J. Chabal ◽  
Glen D. Wilk

ABSTRACTThere is great need for a mechanistic understanding of growth chemistry during atomic layer deposition (ALD) of films for electronic applications. Since commercial ALD reactors are presently not equipped for in situ spectroscopy, we have constructed a model reactor that enables single-pass transmission infrared spectroscopy to be performed in situ on a layer-by-layer basis. We demonstrate the viability of this approach for the study of aluminum oxide growth on silicon surfaces, motivated by alternative gate oxide applications. Thanks to submonolayer dielectric and adsorbate sensitivity, we can quantify oxide thicknesses and hydroxyl areal densities on thermal and chemical SiO2/Si(100) substrates. Methyl formation and hydroxyl consumption upon initial trimethylaluminum (TMA) reaction can also be followed. We verify that in situ grown Al2O3 films are compatible in structure to films grown in a commercial ALD reactor.


2014 ◽  
Vol 6 (15) ◽  
pp. 11891-11898 ◽  
Author(s):  
Jason R. Avila ◽  
Erica J. DeMarco ◽  
Jonathan D. Emery ◽  
Omar K. Farha ◽  
Michael J. Pellin ◽  
...  

2019 ◽  
Vol 37 (2) ◽  
pp. 020602 ◽  
Author(s):  
Peter J. King ◽  
Marko Vehkamäki ◽  
Miika Mattinen ◽  
Mikko J. Heikkilä ◽  
Kenichiro Mizohata ◽  
...  

2020 ◽  
Vol 25 ◽  
pp. 6-12
Author(s):  
Maxim Yu. Maximov ◽  
Yury Koshtyal ◽  
Ilya Mitrofanov ◽  
Ilya Ezhov ◽  
Aleksander Rumyantsev ◽  
...  

2021 ◽  
Vol 3 (1) ◽  
pp. 59-71
Author(s):  
Degao Wang ◽  
Qing Huang ◽  
Weiqun Shi ◽  
Wei You ◽  
Thomas J. Meyer

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