Life prediction of 808nm high power semiconductor laser by accelerated life test of constant current stress

2015 ◽  
Author(s):  
Nan Yao ◽  
Wei Li ◽  
Yihao Zhao ◽  
Li Zhong ◽  
Suping Liu ◽  
...  
Keyword(s):  
Semiconductor Laser ◽  
High Power ◽  
Life Prediction ◽  
Accelerated Life Test ◽  
Constant Current ◽  
Life Test ◽  
Current Stress ◽  
Power Semiconductor ◽  
Accelerated Life

Study of High-Power White LED's Lifetime Based on Accelerated Life Test

2013 ◽  
Vol 800 ◽  
pp. 205-209 ◽  
Author(s):  
De Sheng Li ◽  
Nian Yu Zou ◽  
Yun Cui Zhang ◽  
Xiao Yang He ◽  
Yi Yang
Keyword(s):  
High Power ◽  
Accelerated Life Test ◽  
Reliability Test ◽  
White Led ◽  
Life Test ◽  
Arrhenius Model ◽  
White Leds ◽  
Accelerated Life ◽  
Temperature Levels

The study of LED reliability becomes more and more important with LED widely used in various areas, and accelerated life test (ALT) as an element of reliability test is widely used to predict the lifetime of LED. In this paper, ALTs have been carried out at various current levels and various temperature levels. In the current ALT experiment, three kinds of stressing currents were demonstrated for 1W white LEDs and lumen flux of the tested LEDs were studied, and based on Eyting model, lifetime of the tested LEDs is calculated about 6.86×105h. In the temperature ALT experiment, two kinds of stressing temperature were demonstrated for the same type of white LEDs and lumen flux were also studied, and based on Arrhenius model, lifetime of the tested LEDs is calculated about 7.41×105h. In addition, the color shifting velocity is faster than lumens depreciation velocity was observed in our experiment, which means the lifetime evaluating of white LED should be paid more attention.

scholarly journals Thin Film Al-Al2O3-Al Capacitors With Dielectric Layer Formed at 400℃

1980 ◽  
Vol 6 (3-4) ◽  
pp. 219-222
Author(s):  
S. J. Osadnik ◽  
T. Berlicki
Keyword(s):  
Thin Film ◽  
Room Temperature ◽  
Amorphous Structure ◽  
Accelerated Life Test ◽  
Constant Current ◽  
Life Test ◽  
Oxide Interface ◽  
Electrical Field ◽  
Common Solution ◽  
Accelerated Life

A comparative study is made of Al2O3layers formed at 400℃ in molten KNO3and Al2O3formed at room temperature in a common solution of ammonium pentaborate in ethylene glycol. At 400℃ and constant current (0.5 mA/cm2) the linear anodization range is limited to 2.7 V by scintillation and local oxide breakdowns. Nonporous 200 Å thick (0.4μF/cm2) oxide layers were produced at 2.0 V (400℃) and 8 V (20℃). Electron diffraction indicated aγ-Al2O3structure at an anodization temperature of 400℃ and amorphous structure at room anodization temp. The initial values of tanδwere100 · 10−4 ± 40 · 10−4and400 · 10−4 ± 200 · 10−4respectively.Capacitance and tanδmeasurements during accelerated life test indicated that the films produced at 400℃ are not superior to those formed at room temperature. In both cases a diffusion of metal at the metal-oxide interface seems to be the main ageing mechanism.The internal electrical field measured by the C-V method was unchanged inγ-Al2O3layers during the life test.

Accelerated life test for high-power white LED based on spectroradiometric measurement

2007 ◽  
Author(s):  
Haiping Shen ◽  
Jiangen Pan ◽  
Huajun Feng
Keyword(s):  
High Power ◽  
Accelerated Life Test ◽  
White Led ◽  
Life Test ◽  
Accelerated Life

scholarly journals Life Prediction on a T700 Carbon Fiber Reinforced Cylinder with Limited Accelerated Life Testing Data

2015 ◽  
Vol 2015 ◽  
pp. 1-9
Author(s):  
Ma Xiaobing ◽  
Zhang Yongbo
Keyword(s):  
Carbon Fiber ◽  
Test Data ◽  
Life Prediction ◽  
Rupture Life ◽  
Accelerated Life Testing ◽  
Accelerated Life Test ◽  
Life Testing ◽  
Life Test ◽  
Failure Data ◽  
Accelerated Life

An accelerated life testing investigation was conducted on a composite cylinder that consists of aluminum alloy and T700 carbon fiber. The ultimate failure stress predictions of cylinders were obtained by the mixing rule and verified by the blasting static pressure method. Based on the stress prediction of cylinder under working conditions, the constant stress accelerated life test of the cylinder was designed. However, the failure data cannot be sufficiently obtained by the accelerated life test due to the time limitation. Therefore, most of the data presented to be high censored in high stress level and zero-failure data in low stress level. When using the traditional method for rupture life prediction, the results showed to be of lower confidence. In this study, the consistency of failure mechanism for carbon fiber and cylinder was analyzed firstly. According to the analysis result, the statistical test information of carbon fiber could be utilized for the accelerated model constitution. Then, rupture life prediction method for cylinder was proposed based on the accelerated life test data and carbon fiber test data. In this way, the life prediction accuracy of cylinder could be improved obviously, and the results showed that the accuracy of this method increased by 35%.

Accelerated life test of high power white light emitting diodes based on package failure mechanisms

2011 ◽  
Vol 51 (9-11) ◽  
pp. 1806-1809 ◽  
Author(s):  
S.I. Chan ◽  
W.S. Hong ◽  
K.T. Kim ◽  
Y.G. Yoon ◽  
J.H. Han ◽  
...  
Keyword(s):  
White Light ◽  
High Power ◽  
Light Emitting Diodes ◽  
Failure Mechanisms ◽  
Accelerated Life Test ◽  
Life Test ◽  
Light Emitting ◽  
Accelerated Life ◽  
White Light Emitting Diodes

Life prediction of brazed plate heat exchanger based on several accelerated life test data

2015 ◽  
Vol 29 (6) ◽  
pp. 2341-2348 ◽  
Author(s):  
Mu-Seong Chang ◽  
Tae-Kook Park ◽  
Baek-Ju Sung ◽  
Byung-Oh Choi
Keyword(s):  
Heat Exchanger ◽  
Test Data ◽  
Life Prediction ◽  
Plate Heat Exchanger ◽  
Accelerated Life Test ◽  
Life Test ◽  
Plate Heat ◽  
Accelerated Life ◽  
Brazed Plate Heat Exchanger
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