Analysis and suppression of stray radiation in infrared spectral radiation measurement

Author(s):  
Shufang He ◽  
Yanfei Wang ◽  
Caihong Dai ◽  
Jinyuan Liu ◽  
Guojin Feng
1965 ◽  
Vol 20 (9) ◽  
pp. 1156-1169 ◽  
Author(s):  
W. Gubler ◽  
M. J. O. Strutt

An argon discharge at high pressure (up to 20 atmosph.) and large dc current is described. This discharge is used in the investigation of spontaneous fluctuations of photon radiation. Electron and ion densities are calculated as functions of pressure and temperature from which the continuous emission and absorption coefficients are determined. By comparing the calculated emission with the measured distribution of the infrared spectral radiation intensity in a disk of plasma, which is 0,2 mm in front of the cathode, the radial temperature distribution in the disk is determined. The temperature in the arc axis was found to be independent of the gas pressure and must be higher than 28 000°K. Investigations on electrical conductivity confirm the temperature distributions. Finally, the statistical radiation fluctuations can be calculated by means of the equations given in Part I and are compared with the experimental results. The infrared detector used for all these measurements is also described in Part I. A satisfactory coincidence between calculated and measured values was found.


2017 ◽  
Vol 56 (17) ◽  
pp. 4918 ◽  
Author(s):  
Qijie Tian ◽  
Songtao Chang ◽  
Fengyun He ◽  
Zhou Li ◽  
Yanfeng Qiao

2017 ◽  
Vol 37 (7) ◽  
pp. 0712002
Author(s):  
田棋杰 Tian Qijie ◽  
常松涛 Chang Songtao ◽  
何锋赟 He Fengyun ◽  
乔彦峰 Qiao Yanfeng

2015 ◽  
Vol 64 (5) ◽  
pp. 050702
Author(s):  
Chang Song-Tao ◽  
Sun Zhi-Yuan ◽  
Zhang Yao-Yu ◽  
Zhu Wei

Author(s):  
John A. Reffner ◽  
William T. Wihlborg

The IRμs™ is the first fully integrated system for Fourier transform infrared (FT-IR) microscopy. FT-IR microscopy combines light microscopy for morphological examination with infrared spectroscopy for chemical identification of microscopic samples or domains. Because the IRμs system is a new tool for molecular microanalysis, its optical, mechanical and system design are described to illustrate the state of development of molecular microanalysis. Applications of infrared microspectroscopy are reviewed by Messerschmidt and Harthcock.Infrared spectral analysis of microscopic samples is not a new idea, it dates back to 1949, with the first commercial instrument being offered by Perkin-Elmer Co. Inc. in 1953. These early efforts showed promise but failed the test of practically. It was not until the advances in computer science were applied did infrared microspectroscopy emerge as a useful technique. Microscopes designed as accessories for Fourier transform infrared spectrometers have been commercially available since 1983. These accessory microscopes provide the best means for analytical spectroscopists to analyze microscopic samples, while not interfering with the FT-IR spectrometer’s normal functions.


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