VCSEL line-beam module for LiDAR applications

2021 ◽  
Author(s):  
Yingmin Fan ◽  
Dandan Zhou ◽  
Hongtao Chong ◽  
Bin Zhao ◽  
Peng Wang ◽  
...  
Keyword(s):  
2016 ◽  
Vol 18 (10) ◽  
pp. 105603 ◽  
Author(s):  
Shubo Cheng ◽  
Shaohua Tao
Keyword(s):  

Author(s):  
Ralph Delmdahl ◽  
Rainer Paetzel ◽  
Jan Brune ◽  
Rolf Senczuk ◽  
Christian Gossler ◽  
...  
Keyword(s):  
Lift Off ◽  

2019 ◽  
Vol 26 (5) ◽  
pp. 1489-1495
Author(s):  
Andreas Koch ◽  
Johannes Risch ◽  
Wolfgang Freund ◽  
Theophilos Maltezopoulos ◽  
Marc Planas ◽  
...  

X-ray photon beam diagnostic imagers are located at 24 positions in the European XFEL beam transport system to characterize the X-ray beam properties, and to give feedback for tuning and optimization of the electron acceleration and orbit, the undulators, and the X-ray optics. One year of commissioning allowed experience to be gained with these imagers, which will be reported here. The sensitive Spontaneous Radiation imager is useful for various investigations in spontaneous radiation mode: for undulator adjustments and for low-signal imaging applications. The high-resolution Free-Electron Laser imager, 10 µm spatial resolution, is extensively used for the monitoring of beam position, spot size and shape, gain curve measurements, and also for beam-intensity monitoring. The wide field-of-view pop-in monitors (up to 200 mm) are regularly used for alignment and tuning of the various X-ray optical components like mirrors, slits and monochromators, and also for on-line beam control of a stable beam position at the instruments. The Exit Slit imager after the soft X-ray monochromator provides spectral information of the beam together with multi-channel plate based single-pulse gating. For particular use cases, these special features of the imagers are described. Some radiation-induced degradation of scintillators took place in this initial commissioning phase, providing useful information for better understanding of damage thresholds. Visible-light radiation in the beam pipe generated by upstream bending magnets caused spurious reflections in the optical system of some of the imagers which can be suppressed by aluminium-coated scintillating screens.


1998 ◽  
Vol 08 (02n03) ◽  
pp. 209-216 ◽  
Author(s):  
S. MATSUYAMA ◽  
K. GOTOH ◽  
K. ISHII ◽  
H. YAMAZAKI ◽  
T. SATOH ◽  
...  

We developed a PIXE analysis system which provides spatial distribution images of elements in a region of several cm2 with a spatial resolution of < 0.5 mm. We call this system a submilli-PIXE camera. This system consists of a submilli-beam line, beam scanners and a data acquisition system in which the X-ray energy and the beam position are simultaneously measured. We demonstrate the usefulness of the submilli-PIXE camera by analyzing the surface of a shell and of granite.


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