A flat panel light field 3D display with high resolution for a single user

2021 ◽  
Author(s):  
Jia Jia ◽  
Jianghui Kang ◽  
Yiying Pu ◽  
Min Lu ◽  
Baolin Tan
2017 ◽  
Vol 105 (5) ◽  
pp. 876-891 ◽  
Author(s):  
Dongkyung Nam ◽  
Jin-Ho Lee ◽  
Yang Ho Cho ◽  
Young Ju Jeong ◽  
Hyoseok Hwang ◽  
...  

2021 ◽  
Author(s):  
Yoshiharu Momonoi ◽  
Koya Yamamoto ◽  
Yoshihiro Yokote ◽  
Atsushi Sato ◽  
Yasuhiro Takaki
Keyword(s):  

2021 ◽  
pp. 1-1
Author(s):  
Fuyang Xu ◽  
Xin Yang ◽  
Zimo Liu ◽  
Wenjie Yu ◽  
Qiang Song ◽  
...  

Author(s):  
Takasuke Nagai ◽  
Munekazu Date ◽  
Shinya Shimizu ◽  
Hideaki Kimata

Author(s):  
Ying Yuan ◽  
Xiaorui Wang ◽  
Yang Yang ◽  
Hang Yuan ◽  
Chao Zhang ◽  
...  

Abstract The full-chain system performance characterization is very important for the optimization design of an integral imaging three-dimensional (3D) display system. In this paper, the acquisition and display processes of 3D scene will be treated as a complete light field information transmission process. The full-chain performance characterization model of an integral imaging 3D display system is established, which uses the 3D voxel, the image depth, and the field of view of the reconstructed images as the 3D display quality evaluation indicators. Unlike most of the previous research results using the ideal integral imaging model, the proposed full-chain performance characterization model considering the diffraction effect and optical aberration of the microlens array, the sampling effect of the detector, 3D image data scaling, and the human visual system, can accurately describe the actual 3D light field transmission and convergence characteristics. The relationships between key parameters of an integral imaging 3D display system and the 3D display quality evaluation indicators are analyzed and discussed by the simulation experiment. The results will be helpful for the optimization design of a high-quality integral imaging 3D display system.


2020 ◽  
Vol 35 (S1) ◽  
pp. S38-S42
Author(s):  
Soraia Rodrigues de Azeredo ◽  
Roberto Cesareo ◽  
Angel Guillermo Bustamante Dominguez ◽  
Ricardo Tadeu Lopes

Precious ornaments from the Museum Royal Tombs of Sipán were analyzed by X-ray computed microtomography (microCT). The ornaments analyzed were golden earrings produced by the Moche culture that flourished along the north coast of present-day Peru between approximately 100 and 600 AD. Sipán, also known as Huava Rajada, is a mochica archaeological complex in the north of Peru. In particular, the spectacular jewelry, mainly composed of gold, silver, and copper alloys, gilded copper, and tumbaga, from the Museum “Royal Tombs of Sipán,” in Lambayeque, north of Peru, are some of the most sophisticated metalworking ever produced of pre-Columbian America. A portable microCT system consisting of a high-resolution flat panel detector and a mini X-ray tube were used for the structural analysis of these ornaments. The microCT images show parts of the internal structure, highlighting the manufacturing technique and gold sheets joining techniques of the Moche artisans. Furthermore, the advantage of using the portable microCT system for nondestructive testing is clear when the sample cannot be taken to the laboratory.


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