Bent-fiber near-field scanning optical microscopy probes for use with commercial atomic force microscopes

Author(s):  
Roderick S. Taylor ◽  
Kurt E. Leopold ◽  
Mark A. Wendman ◽  
Gus Gurley ◽  
Virgil B. Elings
2000 ◽  
Vol 104 (51) ◽  
pp. 12098-12101 ◽  
Author(s):  
Christine M. R. Clancy ◽  
Jeffrey R. Krogmeier ◽  
Anna Pawlak ◽  
Malgorzata Rozanowska ◽  
Tadeusz Sarna ◽  
...  

1998 ◽  
Author(s):  
Dietrich Drews ◽  
Wilfried Noell ◽  
Wolfgang Ehrfeld ◽  
Manfred Lacher ◽  
Karsten Mayr ◽  
...  

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