Crystallization process of Ag-Sb-Te alloy and films for phase-change optical data storage

2002 ◽  
Author(s):  
Yagya D. Sharma ◽  
Promod K. Bhatnagar
2001 ◽  
Vol 674 ◽  
Author(s):  
Tae-Yon Lee ◽  
Byung-ki Cheong ◽  
Taek Sung Lee ◽  
Sung Jin Park ◽  
Won Mok Kim ◽  
...  

ABSTRACTA new approach is proposed to obtain fast crystallizing materials based on a conventional GeSbTe alloy for rewritable phase change optical data storage. By means of co-sputtering, Ge1Sb2Te4alloy was mixed with Sn1Bi2Te4alloy so as to form pseudo-binary alloys (Ge1Sb2Te4)1-x(Sn1Bi2Te4)x (x is a mole fraction). From structural and optical analyses of the co- sputtered and annealed alloy films, the formation of stable crystalline single phases was observed along with a Vegard's law behavior, suggesting a homogeneous mixing of the two alloys. By use of a 4 layered disk with (Ge1Sb2Te4)0.85(Sn1Bi2Te4)0.15 recording layer, a preliminary test of writing and erasing was carried out and the results were compared with the case of the disk with Ge1Sb2Te4recording layer. The (Ge1Sb2Te4)0.85(Sn1Bi2Te4)0.15 recording layer was found to yield markedly higher erasibility, especially with increasing disk linear velocity.


2003 ◽  
Vol 803 ◽  
Author(s):  
C. D. Wright ◽  
M. Armand ◽  
M. M. Aziz ◽  
S. Senkader ◽  
W. Yu

ABSTRACTAttempts at the practical utilization of Sb-Te based alloys beyond optical data storage have been made recently by employing these materials in both scanning probe type memories, and in electrical memory devices - namely Phase-Change Random Access Memory (PC-RAM). We have developed models to simulate the electrical, thermal, and phase-change characteristics of this important class of material. In this paper we describe the physical basis of our models and present simulation results for different memory configurations and operating conditions.


Author(s):  
Evan Small ◽  
Sadegh M. Sadeghipour ◽  
Mehdi Asheghi

Demands for the high storage capacities and rates of data transfer have been overwhelming in the recent years. With the increasing use of multimedia, the rewritable optical phase-change disks, e.g. CD and DVD, have become more popular. The optical PC data storage devices provide relatively short data access rates (∼ 10 MHz) and moderate areal densities. As in other areas of data storage, there has been tremendous demand and pressure, driven by consumer application, for inexpensive high-density PC systems. So far, the optical data storage industry has managed to meet the demands by using lasers with shorter wavelengths and objective lenses with higher numerical aperture (NA). Several strategies such as “multilevel storage layers” [1] and “mark radial width modulation” [2] have been proposed for the next generation of the high-density PC data storage devices. There have been advances in near field optical techniques to increase density (40 Gb/in) using solid immersion lens [3]. Hosaka et al. [4] demonstrated 60 nm domains in phase change media that translates to 170 Gb/in2 using a scanning near-filed optical microscope. Kado and Tohda [5] used an atomic force microscope (AFM) to locally modify the electrical property (×100) of a PC material by applying an electrical pulse between the probe and media. They achieved an areal density near 1 Tbits/cm2.


1992 ◽  
Vol 7 (3) ◽  
pp. 741-744 ◽  
Author(s):  
D.P. Birnie ◽  
J.D. Weinberg ◽  
D.G. Swanson

Several copper vanadium oxide melts were tested for possible application as the active medium in phase-change optical data storage devices. These materials were melted in the bulk and then quenched. Their phase development was characterized to help determine their applicability to optical data storage. It was found that they satisfy many of the criteria necessary for successful phase-change data storage; further studies of their behavior in thin film geometry would be warranted.


1986 ◽  
Vol 49 (9) ◽  
pp. 502-504 ◽  
Author(s):  
M. Chen ◽  
K. A. Rubin ◽  
R. W. Barton

1997 ◽  
Vol 71 (15) ◽  
pp. 2088-2090 ◽  
Author(s):  
Chubing Peng ◽  
M. Mansuripur ◽  
W. M. Kim ◽  
S. G. Kim

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