Usage of total reflection for optical quality control of anisotropic thin films

2005 ◽  
Author(s):  
Alisa Konstantinova ◽  
Konstantin Konstantinov
1988 ◽  
Vol 32 ◽  
pp. 105-114 ◽  
Author(s):  
H. Schwenke ◽  
W. Berneike ◽  
J. Knoth ◽  
U. Weisbrod

AbstractThe total reflection of X-rays is mainly determined by three parameters , that is the orltical angle, the reflectivity and the penetration depth. For X-ray fluorescence analysis the respective characteristic features can be exploited in two rather different fields of application. In the analysis of trace elements in samples placed as thin films on optical flats, detection limits as low as 2 pg or 0.05 ppb, respectively, have been obtained. In addition, a penetration depth in the nanometer regime renders Total Reflection XRF an inherently sensitive method for the elemental analysis of surfaces. This paper outlines the main physical and constructional parameters for instrumental design and quantitation in both branches of TXRF.


1997 ◽  
Vol 234 (4) ◽  
pp. 251-261
Author(s):  
N. Markovska ◽  
J. Pop-Jordanov ◽  
E.A. Solov'ev

Batteries ◽  
2021 ◽  
Vol 7 (4) ◽  
pp. 64
Author(s):  
Louisa Hoffmann ◽  
Manuel Kasper ◽  
Maik Kahn ◽  
Georg Gramse ◽  
Gabriela Ventura Silva ◽  
...  

Lithium-ion batteries are a key technology for electromobility; thus, quality control in cell production is a central aspect for the success of electric vehicles. The detection of defects and poor insulation behavior of the separator is essential for high-quality batteries. Optical quality control methods in cell production are unable to detect small but still relevant defects in the separator layer, e.g., pinholes or particle contaminations. This gap can be closed by executing high-potential testing to analyze the insulation performance of the electrically insulating separator layer in a pouch cell. Here, we present an experimental study to identify different separator defects on dry cell stacks on the basis of electric voltage stress and mechanical pressure. In addition, finite element modeling (FEM) is used to generate physical insights into the partial discharge by examining the defect structures and the corresponding electric fields, including topographical electrode roughness, impurity particles, and voids in the separator. The test results show that hard discharges are associated with significant separator defects. Based on the study, a voltage of 350 to 450 V and a pressure of 0.3 to 0.6 N/mm2 are identified as optimum ranges for the test methodology, resulting in failure detection rates of up to 85%.


2018 ◽  
Vol 5 (12) ◽  
pp. 125902 ◽  
Author(s):  
Yu P Gnatenko ◽  
P M Bukivskij ◽  
M S Furier ◽  
A P Bukivskii ◽  
A S Opanasyuk

1996 ◽  
Vol 284-285 ◽  
pp. 420-423 ◽  
Author(s):  
Keizo Kato ◽  
Hitoshi Saiki ◽  
Hisashi Okuchi ◽  
Futao Kaneko ◽  
Takashi Wakamatsu ◽  
...  

2011 ◽  
Vol 50 (5) ◽  
pp. 696 ◽  
Author(s):  
Takashi Wakamatsu ◽  
Tadaaki Kitami ◽  
Tomoaki Maruyama ◽  
Susumu Toyoshima

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