Possibilities for misidentification of natural diamond and coesite in metamorphic rocks

The value of Electron Microscope studies of imperfect natural diamonds

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100174102 ◽

1990 ◽

Vol 48 (4) ◽

pp. 194-195

Author(s):

J C Walmsley ◽

A R Lang

Keyword(s):

Electron Microscope ◽

Classification Scheme ◽

Natural Diamond ◽

Sudden Change ◽

Growth Conditions ◽

Diamond Growth ◽

Major Constituent ◽

Natural Diamonds ◽

Type Ia ◽

Platelet Defects

Interest in the defects and impurities in natural diamond, which are found in even the most perfect stone, is driven by the fact that diamond growth occurs at a depth of over 120Km. They display characteristics associated with their origin and their journey through the mantle to the surface of the Earth. An optical classification scheme for diamond exists based largely on the presence and segregation of nitrogen. For example type Ia, which includes 98% of all natural diamonds, contain nitrogen aggregated into small non-paramagnetic clusters and usually contain sub-micrometre platelet defects on {100} planes. Numerous transmission electron microscope (TEM) studies of these platelets and associated features have been made e.g. . Some diamonds, however, contain imperfections and impurities that place them outside this main classification scheme. Two such types are described.First, coated-diamonds which possess gem quality cores enclosed by a rind that is rich in submicrometre sized mineral inclusions. The transition from core to coat is quite sharp indicating a sudden change in growth conditions, Figure 1. As part of a TEM study of the inclusions apatite has been identified as a major constituent of the impurity present in many inclusion cavities, Figure 2.

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TEM/AEM characterization of fine-grained clay minerals in very-low-grade rocks: Evaluation of contamination by empa involving celadonite family minerals

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100165938 ◽

1996 ◽

Vol 54 ◽

pp. 694-695

Author(s):

Gejing Li ◽

D. R. Peacor ◽

D. S. Coombs ◽

Y. Kawachi

Keyword(s):

Electron Microscopy ◽

Volcanic Rocks ◽

Analytical Electron Microscopy ◽

Metamorphic Rocks ◽

New Mineral ◽

Chemical Compositions ◽

Low Grade ◽

Fine Grained ◽

Depth Analysis ◽

Mineral Aggregates

Recent advances in transmission electron microscopy (TEM) and analytical electron microscopy (AEM) have led to many new insights into the structural and chemical characteristics of very finegrained, optically homogeneous mineral aggregates in sedimentary and very low-grade metamorphic rocks. Chemical compositions obtained by electron microprobe analysis (EMPA) on such materials have been shown by TEM/AEM to result from beam overlap on contaminant phases on a scale below resolution of EMPA, which in turn can lead to errors in interpretation and determination of formation conditions. Here we present an in-depth analysis of the relation between AEM and EMPA data, which leads also to the definition of new mineral phases, and demonstrate the resolution power of AEM relative to EMPA in investigations of very fine-grained mineral aggregates in sedimentary and very low-grade metamorphic rocks.Celadonite, having end-member composition KMgFe3+Si4O10(OH)2, and with minor substitution of Fe2+ for Mg and Al for Fe3+ on octahedral sites, is a fine-grained mica widespread in volcanic rocks and volcaniclastic sediments which have undergone low-temperature alteration in the oceanic crust and in burial metamorphic sequences.

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