A Thick Overgrowth of CVD Synthetic Diamond on a Natural Diamond

2018 ◽  
Vol 36 (2) ◽  
pp. 134-141
Author(s):  
Shi Tang ◽  
Jun Su ◽  
Taijin Lu ◽  
Yongwang Ma ◽  
Jie Ke ◽  
...  
CrystEngComm ◽  
2021 ◽  
Author(s):  
Shuai Fang ◽  
Yongkui Wang ◽  
Liangchao Chen ◽  
Zhiyun Lu ◽  
Zhenghao Cai ◽  
...  

Pressure is a necessary condition for the growth of natural diamond. Studying the effect of pressure on the nitrogen content of diamond is important for exploring the growth mechanism of...


1994 ◽  
Vol 339 ◽  
Author(s):  
D. M. Hofmann ◽  
W. Stadler ◽  
B. K. Meyer ◽  
L. Pereira ◽  
L. Santos ◽  
...  

ABSTRACTTime resolved photoluminescence and optically detected magnetic resonance experiments were performed on the 2.985 eV (N3) luminescence band in natural diamond and the 2.964 eV luminescence center in synthetic diamonds. For the N3 luminescence the resonance occurs in the 2E excited state of the center. On the 2.964 eV luminescence a strongly anisotropie resonance signal is observed. The frequency response of the magnetic resonance signals confirms the time resolved photoluminescence measurements.


MRS Advances ◽  
2017 ◽  
Vol 2 (41) ◽  
pp. 2229-2234
Author(s):  
Susanna Challinger ◽  
Iain Baikie ◽  
A. Glen Birdwell

ABSTRACTDiamond is a promising wide band-gap semiconductor material for use in devices; therefore a thorough understanding of the surface electronic structure is important. The Kelvin Probe (KP), Surface Photovoltage / Surface Photovoltage Spectroscopy (SPV/SPS) and Ambient Pressure Photoemission Spectroscopy (APS) techniques are commonly applied to traditional and organic semiconductor materials. The application of these techniques to synthetic and natural diamond samples provides some challenges: surface charge on the samples and atypical capacitive interaction with the KP tip. In this study, measurements using a combination of KP, SPV/SPS and APS techniques are taken of samples of natural and synthetic diamond samples to investigate their surface electronic structure and compare their different properties. These techniques are all non-contact and non-destructive. The Fermi Level position of the diamond samples was found to vary, typically between 4.3 – 4.9 eV, depending on the light illumination. For example, when a natural diamond sample was illuminated with 400 nm light from a 150W Quartz Tungsten Halogen light source, there was a surface photovoltage response of ∼250 mV. The oxygen terminated synthetic diamond sample required near continuous illumination at low visible wavelengths in order to retain sufficient conductivity to allow measurement with the Kelvin Probe. By contrast, the natural diamond samples measured showed good conductivity in the layers underneath the top surface. In summary, the KP, SPV/SPS and APS measurement techniques provided some interesting information on the diamond samples and an initial investigation of their surface electronic states is performed.


1990 ◽  
Vol 5 (11) ◽  
pp. 2483-2489 ◽  
Author(s):  
K. Tankala ◽  
T. DebRoy ◽  
M. Alam

Oxidation of polycrystalline diamond films on (111) Si wafers in air at temperatures up to 1073 K was investigated by thermogravimetry. The diamond films before and after partial oxidation were characterized by optical and scanning electron microscopy, x-ray, infrared, and Raman spectroscopy. The oxidation of synthetic diamond films started at a lower temperature than that for natural diamond. The rates of oxidation of the diamond films synthesized by the hot filament and the microwave plasma methods were intermediate between the rates of oxidation of the 111 and 100 planes of natural diamond crystals. The apparent activation energy for the oxidation of the synthetic diamond films agreed well with that for the oxidation of natural diamond via diamond to graphite transition at low oxygen pressures.


2021 ◽  
Vol 5 (2) ◽  
pp. 177-182
Author(s):  
Maksym Tsysar ◽  
Sergey Ivakhnenko ◽  
Anatoliy Zakora ◽  
Galina Ilnitska ◽  
Oleg Zanevsky ◽  
...  

This article focuses on the problem of using large single crystals of type Ib synthetic diamond in single crystal and drilling tools. According to the literature review for the use of large diamonds in drilling equipment relevant conditions. The is shown possible negative effects of the temperature load on the diamond single crystal. The is presented developed technique for estimating the static strength of large diamond single crystals. It has been shown that microcrystals in the form of octahedra and cubes are formed as a result of heat treatment on the surface of synthetic diamond single crystals. The results of studies of the strength of large single crystals of synthetic diamonds of millimeter size are shown. In contrast to the classical approach, when IIb crystals are used for the production of drilling equipment, we present Ib crystals because they are closer to natural diamond in terms of physical and mechanical properties. The static strength criterion was used to assess the strength. It has been shown that crystals with a size of 1000 ... 1100 μm have a higher value of static strength than crystals with a size of 1200 μm and larger.


1993 ◽  
Vol 302 ◽  
Author(s):  
L. S. Pan ◽  
S. Han ◽  
D. R. Kania ◽  
W. Banholzer

ABSTRACTSingle-crystal type IIa diamonds were synthesized by applying high temperatures (1200°;C) and high pressures (52000 atm) to powdered polycrystalline diamond grown using conventional CVD techniques. These samples were isotopically pure, consisting of approximately 99.93% 12C, compared to roughly 98.96% in natural IIa diamonds. In addition, the dislocation density of the synthetic samples is significantly lower than in natural IIa diamonds, as indicated by birefringence measurements. Electrical properties of these samples were measured using transient photoconductivity, where a 3 ps pulse of ultraviolet light (6.1 eV) was used to excite free electron-hole pairs. Compared to natural IIa diamonds, the lifetime at low fields (200 V/cm) and low excitation densities (1015 cm-3) in the synthetic sample was significantly longer (1 ns in the synthetic sample vs. 200 to 300 ps in natural diamond). At higher fields, a much longer decay component, exceeding 10 ns, was observed in the synthetic sample. Combined electron and hole mobilities were around 2500 cm2/V-s in the synthetic diamond, compared to 3000 to 4000 cm2/V-s in the best natural samples. At a field of 2 kV/cm, the drift distance in the synthetic sample was over 50 μm, considerably longer than that of natural diamond (10 μm). This is due primarily to the much longer carrier lifetimes. The longer lifetimes in the synthetic sample demonstrate that the properties of the best natural diamonds can be exceeded and are encouraging for the development of sensitive diamond radiation detectors. These longer lifetimes are likely due to the higher quality and lower defect density in the synthetic samples, rather than the isotopic purity.


Author(s):  
J C Walmsley ◽  
A R Lang

Interest in the defects and impurities in natural diamond, which are found in even the most perfect stone, is driven by the fact that diamond growth occurs at a depth of over 120Km. They display characteristics associated with their origin and their journey through the mantle to the surface of the Earth. An optical classification scheme for diamond exists based largely on the presence and segregation of nitrogen. For example type Ia, which includes 98% of all natural diamonds, contain nitrogen aggregated into small non-paramagnetic clusters and usually contain sub-micrometre platelet defects on {100} planes. Numerous transmission electron microscope (TEM) studies of these platelets and associated features have been made e.g. . Some diamonds, however, contain imperfections and impurities that place them outside this main classification scheme. Two such types are described.First, coated-diamonds which possess gem quality cores enclosed by a rind that is rich in submicrometre sized mineral inclusions. The transition from core to coat is quite sharp indicating a sudden change in growth conditions, Figure 1. As part of a TEM study of the inclusions apatite has been identified as a major constituent of the impurity present in many inclusion cavities, Figure 2.


Author(s):  
Z.L. Wang ◽  
J. Bentley ◽  
R.E. Clausing ◽  
L. Heatherly ◽  
L.L. Horton

It has been found that the abrasion of diamond-on-diamond depends on the crystal orientation. For a {100} face, the friction coefficient for sliding along <011> is much higher than that along <001>. For a {111} face, the abrasion along <11> is different from that in the reverse direction <>. To interpret these effects, a microcleavage mechanism was proposed in which the {100} and {111} surfaces were assumed to be composed of square-based pyramids and trigonal protrusions, respectively. Reflection electron microscopy (REM) has been applied to image the microstructures of these diamond surfaces.{111} surfaces of synthetic diamond:The synthetic diamonds used in this study were obtained from the De Beers Company. They are in the as-grown condition with grain sizes of 0.5-1 mm without chemical treatment or mechanical polishing. By selecting a strong reflected beam in the reflection high-energy electron diffraction (RHEED) pattern, the dark-field REM image of the surface is formed (Fig. 1).


2015 ◽  
Vol 34 (8) ◽  
pp. 702-710
Author(s):  
Yan Lan ◽  
Rong Liang ◽  
Taijin Lu ◽  
Yong Zhu ◽  
Tianyang Zhang ◽  
...  

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