CHEMICAL IMAGING OF DIAMONDS BY TIME OF FLIGHT SECONDARY IONIZATION MASS SPECTROMETRY

Mapping Intimacies ◽

10.1130/abs/2018am-323826 ◽

2018 ◽

Author(s):

Tyler Sundell ◽

◽

Gary S. Michelfelder

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Chemical Imaging ◽

Ionization Mass Spectrometry ◽

Ionization Mass ◽

Secondary Ionization Mass Spectrometry

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Molecular Surface Sampling and Chemical Imaging using Proximal Probe Thermal Desorption/Secondary Ionization Mass Spectrometry

Analytical Chemistry ◽

10.1021/ac102766w ◽

2011 ◽

Vol 83 (2) ◽

pp. 598-603 ◽

Author(s):

Olga S. Ovchinnikova ◽

Vilmos Kertesz ◽

Gary J. Van Berkel

Keyword(s):

Mass Spectrometry ◽

Thermal Desorption ◽

Chemical Imaging ◽

Molecular Surface ◽

Ionization Mass Spectrometry ◽

Ionization Mass ◽

Surface Sampling ◽

Secondary Ionization Mass Spectrometry

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Enhancement of ion intensity in time-of-flight secondary-ionization mass spectrometry

Journal of the American Society for Mass Spectrometry ◽

10.1016/1044-0305(96)00006-2 ◽

1996 ◽

Vol 7 (5) ◽

pp. 467-472 ◽

Author(s):

Anthony J. Nicola ◽

David C. Muddiman ◽

David M. Hercules

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Ionization Mass Spectrometry ◽

Ionization Mass ◽

Secondary Ionization Mass Spectrometry

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Non-target screening of (semi-)volatiles in food-grade polymers by comparison of atmospheric pressure gas chromatography quadrupole time-of-flight and electron ionization mass spectrometry

Talanta ◽

10.1016/j.talanta.2019.05.029 ◽

2019 ◽

Vol 202 ◽

pp. 285-296 ◽

Author(s):

Qi-Zhi Su ◽

Paula Vera ◽

Cathy Van de Wiele ◽

Cristina Nerín ◽

Qin-Bao Lin ◽

...

Keyword(s):

Mass Spectrometry ◽

Gas Chromatography ◽

Atmospheric Pressure ◽

Time Of Flight ◽

Electron Ionization ◽

Electron Ionization Mass Spectrometry ◽

Ionization Mass Spectrometry ◽

Ionization Mass ◽

Target Screening

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Chemical Imaging of Cyanoacrylate-Fumed Fingerprints by Matrix-assisted Laser Desorption/Ionization Mass Spectrometry Imaging,

Journal of Forensic Sciences ◽

10.1111/1556-4029.13773 ◽

2018 ◽

Vol 63 (6) ◽

pp. 1854-1857 ◽

Author(s):

Kelly C. O'Neill ◽

Paige Hinners ◽

Young Jin Lee

Keyword(s):

Mass Spectrometry ◽

Mass Spectrometry Imaging ◽

Laser Desorption ◽

Chemical Imaging ◽

Ionization Mass Spectrometry ◽

Ionization Mass ◽

Laser Desorption Ionization ◽

Desorption Ionization ◽

Matrix Assisted Laser ◽

Matrix Assisted Laser Desorption

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Evidence for a mechanism that involves secondary electron capture in the liquid secondary ionization mass spectrometry beam-induced dehalogenation of organic compounds

Journal of the American Society for Mass Spectrometry ◽

10.1016/s1044-0305(96)89165-3 ◽

1996 ◽

Vol 7 (11) ◽

pp. 1109-1115 ◽

Author(s):

R. Théberge ◽

M.J. Bertrand

Keyword(s):

Mass Spectrometry ◽

Organic Compounds ◽

Electron Capture ◽

Secondary Electron ◽

Ionization Mass Spectrometry ◽

Ionization Mass ◽

Secondary Ionization Mass Spectrometry

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Ion Microscopy with Resonant Ionization Mass Spectrometry: Time-of-Flight Depth Profiling with Improved Isotopic Precision

European Journal of Mass Spectrometry ◽

10.1255/ejms.1085 ◽

2010 ◽

Vol 16 (3) ◽

pp. 373-377 ◽

Author(s):

Michael J. Pellin ◽

Igor V. Veryovkin ◽

Jonathan Levine ◽

Alexander Zinovev ◽

Andrew M. Davis ◽

...

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Depth Profiling ◽

Ionization Mass Spectrometry ◽

Ionization Mass ◽

Resonant Ionization ◽

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Secondary ionization mass spectrometry imaging of dilute stable strontium labeling in dentin and enamel

Bone ◽

10.1016/j.bone.2007.08.037 ◽

2008 ◽

Vol 42 (1) ◽

pp. 229-234 ◽

Author(s):

Vincent Balter ◽

Bruno Reynard

Keyword(s):

Mass Spectrometry ◽

Mass Spectrometry Imaging ◽

Ionization Mass Spectrometry ◽

Ionization Mass ◽

Secondary Ionization Mass Spectrometry ◽

Stable Strontium

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Mass spectrometry of labile onium ions and carbocation salts. Study by desorption-ionization mass spectrometry: Fast atom bombardment, field desorption and252Cf plasma desorption time-of-flight mass spectrometry

Organic Mass Spectrometry ◽

10.1002/oms.1210231006 ◽

1988 ◽

Vol 23 (10) ◽

pp. 705-711 ◽

Author(s):

Khosrow Laali ◽

Derry L. Fishel ◽

Robert P. Lattimer ◽

Jerry E. Hunt

Keyword(s):

Mass Spectrometry ◽

Fast Atom Bombardment ◽

Time Of Flight ◽

Ionization Mass Spectrometry ◽

Ionization Mass ◽

Field Desorption ◽

Desorption Ionization ◽

Plasma Desorption ◽

Flight Mass Spectrometry ◽

Desorption Time

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Ultraviolet laser desorption/ionization mass spectrometry of proteins above 100,000 daltons by pulsed ion extraction time-of-flight analysis

Analytical Chemistry ◽

10.1021/ac00207a004 ◽

1990 ◽

Vol 62 (8) ◽

pp. 793-796 ◽

Author(s):

Bernhard. Spengler ◽

Robert J. Cotter

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Laser Desorption ◽

Extraction Time ◽

Ionization Mass Spectrometry ◽

Ionization Mass ◽

Laser Desorption Ionization ◽

Ultraviolet Laser ◽

Ion Extraction ◽

Desorption Ionization

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A Study of Novel Organic Optoelectronics Materials Based on Thiophene and Silicon by Time-of-Flight Laser Desorption/Ionization Mass Spectrometry

Journal of Analytical Chemistry ◽

10.1134/s1061934818130129 ◽

2018 ◽

Vol 73 (13) ◽

pp. 1292-1300

Author(s):

A. P. Pleshkova ◽

E. S. Kuznetsova

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Laser Desorption ◽

Ionization Mass Spectrometry ◽

Ionization Mass ◽

Laser Desorption Ionization ◽

Desorption Ionization ◽

Organic Optoelectronics

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