Nanoparticles of Iron Oxides in Thin Films on the Surfaces of Natural Quartz Crystals

2020 ◽  
Vol 492 (2) ◽  
pp. 415-417
Author(s):  
N. N. Piskunova
2006 ◽  
Vol 70 (18) ◽  
pp. A298 ◽  
Author(s):  
A.-L. Jourdan ◽  
T.W. Vennemann ◽  
J. Mullis ◽  
K. Ramseyer

2007 ◽  
Vol 40 (16) ◽  
pp. 4866-4871 ◽  
Author(s):  
A P Caricato ◽  
Y V Kudryavtsev ◽  
G Leggieri ◽  
A Luches ◽  
S A Mulenko

1991 ◽  
Vol 251 ◽  
Author(s):  
F. C. Luan ◽  
M. S. Paterson

ABSTRACTIn 1965 Griggs and Blacic [1,2] proposed that there is a “hydrolytic weakening” process in quartz and silicates whereby the breaking of Si-O bonds, involved in the movement of dislocations, is facilitated by the presence of water. This proposal aimed to explain the observed dramatic weakening of quartz crystals when they are exposed to water in tests at high temperature, as well as the observed strong contrast in creep strength between dry natural quartz crystals and rapidly-grown synthetic quartz crystals containing traces of water. Such a “hydrolytic” process may also underlie the observed effects of water in accelerating other phenomena such as self-diffusion of oxygen in quartz, aluminium-silicon ordering in feldspars, slow crack propagation in silicates, and recrystallization in quartz. A review of this field is given in Reference 3.


ChemInform ◽  
1989 ◽  
Vol 20 (52) ◽  
Author(s):  
C. ORTIZ ◽  
T. MANOUBI ◽  
C. COLLIEX

1988 ◽  
Vol 49 (C8) ◽  
pp. C8-2009-C8-2010
Author(s):  
C. Ortiz ◽  
T. Manoubi ◽  
C. Colliex

2013 ◽  
Vol 704 ◽  
pp. 275-280
Author(s):  
Janina Setina ◽  
Alona Gabrene ◽  
Inna Juhnevica ◽  
Gundars Mezinskis

The paper describes two methods of syntheses of iron oxides, microstructure and morphology of magnetite nanoparticles. Nanocomposite thin films of SiO2/Fe3O4 have been prepared with sol-gel dip coating technique: dip-coating from SiO2/Fe3O4 sol and encapsulation magnetite between two SiO2 layers. Structural and morphological characteristics of iron oxides particles and prepared film were analyzed by X-Ray Diffraction, SEM, FTIR, DTA, AFM. AFM topography of surface and measurements of roughness has shown that using iron oxide encapsulation between two SiO2 layers to provide the even distribution of iron oxide, results as high quality films with low Rq values 1.5 2.7 nm.


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