An Asymptotic Method for Solving the Problem of Identifying a Curvilinear Crack in an Elastic Layer

2020 ◽  
Vol 56 (10) ◽  
pp. 810-819
Author(s):  
A. O. Vatul’yan ◽  
O. V. Yavruyan
2011 ◽  
Vol 42 (3) ◽  
pp. 267-283
Author(s):  
Rehan Ali Shah ◽  
Saeed Islam ◽  
A. M. Siddiqui ◽  
Ishtiaq Ali ◽  
Manzoor Ellahi

2017 ◽  
Vol 5 (1) ◽  
pp. 45-50
Author(s):  
Myron Voytko ◽  
◽  
Yaroslav Kulynych ◽  
Dozyslav Kuryliak

The problem of the elastic SH-wave diffraction from the semi-infinite interface defect in the rigid junction of the elastic layer and the half-space is solved. The defect is modeled by the impedance surface. The solution is obtained by the Wiener- Hopf method. The dependences of the scattered field on the structure parameters are presented in analytical form. Verifica¬tion of the obtained solution is presented.


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