The use of automated image analysis in coal petrology

A comparison was made between the data obtained using the Zeiss image analyser (IBAS) and those obtained by conventional methods, using polished, particulate and blocks of coal. The results obtained by using the two methods are in good agreement.IBAS is an automatic system and reduces the data (reflectance measurement and point count analysis) collecting time substantially, compared with conventional methods. Seam profiles, based on polished blocks, can be constructed rapidly using IBAS to determine the paleoenvironment of coal deposition or the position of macerals resistant to grinding. Also, evaluation and presentation of large numbers of coal samples can be performed in a short time by using polished, particulate blocks.

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Use of automated image analysis in coal petrology. Note

International Journal of Rock Mechanics and Mining Sciences & Geomechanics Abstracts ◽

10.1016/0148-9062(88)92755-6 ◽

1988 ◽

Vol 25 (1) ◽

pp. A5

Keyword(s):

Image Analysis ◽

Automated Image Analysis ◽

Coal Petrology

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Use of image analysis in the measurement of finite strain by the normalized Fry Method: geological implications for the ‘Zone Houillère’ (Briançonnais zone, French Alps)

Mineralogical Magazine ◽

10.1180/minmag.1995.059.395.02 ◽

1995 ◽

Vol 59 (395) ◽

pp. 179-187 ◽

Cited By ~ 13

Author(s):

L. Ailleres ◽

M. Champenois ◽

J. Macaudiere ◽

J.M. Bertrand

Keyword(s):

Image Analysis ◽

Finite Strain ◽

Automated Image Analysis ◽

French Alps ◽

Strain Data ◽

Image Analyser ◽

Fry Method ◽

Seismic Reflectors ◽

Quartz Grains ◽

Image Analysis Techniques

AbstractImage analysis techniques are used to quantify finite strain in microconglomerates from the ‘Zone Houillère’ (Briançonnais Zone, French Alps) using the normalized Fry method. Two different techniques have been developed to extract the necessary parameters from quartz grains: the first uses an interactive videographic image analyser linked to a digitizer, and the second uses a semi-automatic image analyser algorithm working on numeric images. Comparison between these two techniques allows the data provided by the latter to be validated. Semi-automated image analysis is then employed to compute the characteristics of the finite strain ellipse as defined by the normalized Fry method. This has been tested on natural and simulated fabrics and gives accurate results. Finally, these techniques have been applied to samples from the French Alps, in an attempt to correlate the regional pattern of finite strain with deep seismic reflectors. This paper presents the preliminary results using finite strain data determined by image analysis processing.

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Use of automated image analysis in coal petrology. Note

International Journal of Rock Mechanics and Mining Sciences & Geomechanics Abstracts ◽

10.1016/0148-9062(88)91907-9 ◽

1988 ◽

Vol 25 (2) ◽

pp. 57

Keyword(s):

Image Analysis ◽

Automated Image Analysis ◽

Coal Petrology

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Automated Image Analysis Of Nuclear And Cytoplasmic Changes In Exfoliated Cells From Tracheas Treated With Carcinogen

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100078638 ◽

1977 ◽

Vol 35 ◽

pp. 220-221

Author(s):

S.F. Stinson ◽

J.C. Lilga ◽

M.B. Sporn

Keyword(s):

Image Analysis ◽

Pattern Analysis ◽

Relative Proportion ◽

Automated Image Analysis ◽

Image Analyzer ◽

Cross Sectional ◽

Exfoliated Cells ◽

Neoplastic Lesions ◽

Analysis System ◽

Morphologic Criterion

Increased nuclear size, resulting in an increase in the relative proportion of nuclear to cytoplasmic sizes, is an important morphologic criterion for the evaluation of neoplastic and pre-neoplastic cells. This paper describes investigations into the suitability of automated image analysis for quantitating changes in nuclear and cytoplasmic cross-sectional areas in exfoliated cells from tracheas treated with carcinogen.Neoplastic and pre-neoplastic lesions were induced in the tracheas of Syrian hamsters with the carcinogen N-methyl-N-nitrosourea. Cytology samples were collected intra-tracheally with a specially designed catheter (1) and stained by a modified Papanicolaou technique. Three cytology specimens were selected from animals with normal tracheas, 3 from animals with dysplastic changes, and 3 from animals with epidermoid carcinoma. One hundred randomly selected cells on each slide were analyzed with a Bausch and Lomb Pattern Analysis System automated image analyzer.

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Progress In The Practical Application Of Automated Image Analysis To Tem Negatives

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100078614 ◽

1977 ◽

Vol 35 ◽

pp. 214-217

Author(s):

F. A. Heckman ◽

E. Redman ◽

J.E. Connolly

Keyword(s):

Image Analysis ◽

Image Quality ◽

Exposure Time ◽

Image Contrast ◽

Automated Image Analysis ◽

Practical Application ◽

Factors Affecting ◽

High Image Quality ◽

Qualitative Evidence ◽

Comprehensive Study

In our initial publication on this subject1) we reported results demonstrating that contrast is the most important factor in producing the high image quality required for reliable image analysis. We also listed the factors which enhance contrast in order of the experimentally determined magnitude of their effect. The two most powerful factors affecting image contrast attainable with sheet film are beam intensity and KV. At that time we had only qualitative evidence for the ranking of enhancing factors. Later we carried out the densitometric measurements which led to the results outlined below.Meaningful evaluations of the cause-effect relationships among the considerable number of variables in preparing EM negatives depend on doing things in a systematic way, varying only one parameter at a time. Unless otherwise noted, we adhered to the following procedure evolved during our comprehensive study:Philips EM-300; 30μ objective aperature; magnification 7000- 12000X, exposure time 1 second, anti-contamination device operating.

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Interfacing of a TEM/STEM System to a Computer

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100097818 ◽

1981 ◽

Vol 39 ◽

pp. 250-251

Author(s):

P. Hagemann

Keyword(s):

Image Analysis ◽

Transmission Rate ◽

Analytical Electron Microscopy ◽

Signal Beam ◽

Automated Image Analysis ◽

Beam Deflection ◽

External Control ◽

Computer Input ◽

Instrument Control ◽

Data Acquisition And Processing

The use of computers in the analytical electron microscopy today shows three different trends (1) automated image analysis with dedicated computer systems, (2) instrument control by microprocessors and (3) data acquisition and processing e.g. X-ray or EEL Spectroscopy.While image analysis in the T.E.M. usually needs a television chain to get a sequential transmission suitable as computer input, the STEM system already has this necessary facility. For the EM400T-STEM system therefore an interface was developed, that allows external control of the beam deflection in TEM as well as the control of the STEM probe and video signal/beam brightness on the STEM screen.The interface sends and receives analogue signals so that the transmission rate is determined by the convertors in the actual computer periphery.

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Failure Analysis of Electronic and Microelectronic Components with a New Automatic Target Preparation System

ISTFA 2005: Conference Proceedings from the 31st International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2005p0327 ◽

2005 ◽

Author(s):

Katja Reiter ◽

Hans Bundgaard

Keyword(s):

Failure Analysis ◽

Automatic System ◽

Material Removal ◽

Electronics Packaging ◽

Target Preparation ◽

Packaging Industry ◽

Short Time ◽

Microelectronic Components ◽

Automatic Preparation ◽

Excellent Reproducibility

Abstract Based on the requirements regarding target, reproducibility, and specimen surface quality, an automatic system for controlled material removal and target preparation has been developed. The tool is for metallographic failure analysis of electric and microelectronic components, and provides an accuracy of 5 micrometer. This article presents details of sample preparation and device evaluation methods. The images presented show typical objects of examination in the analysis of microstructures and materials in the electronics packaging industry with brief comments. For automatically controlled material removal and preparation, the tool offers alignment and measuring of the sample prior to the preparation. The desired preparation layers were achieved precisely and reproducibly with several specimens of the same kind. The automatic preparation system allowed the preparation of critical samples within a short time, with high precision and with excellent reproducibility.

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