Interference Effects in Neutron and X Ray Scattering

1974 ◽  
Vol 52 (22) ◽  
pp. 2281-2298 ◽  
Author(s):  
H. R. Glyde

The properties of interference between the one and multiphonon contributions to the dynamic and static scattering functions, S(Q, ω) and S(Q), first considered by Ambegaokar et al., are discussed in detail for b.c.c 3He and 4He for comparison with recent neutron and proposed X ray scattering experiments. Calculations of interference for Na and of the Debye temperature appropriate to the Debye–Waller factor in b.c.c 3He are also presented. In all cases the on shell interference term which alters the one phonon scattering intensity is found to be more important than the off shell term which alters the one phonon line shape. This is characteristic of systems in which anharmonic effects produce a large phonon frequency shift but in which the phonon lifetimes remain long. The difficulty in establishing the one phonon sum rules experimentally in the presence of interference is emphasized. As noted by Horner, existing unusual variations of scattering intensity observed in solid 4He can be satisfactorily explained by taking account of interference and this difficulty without introducing an anomolous Debye–Waller factor. Comparisons with liquid 4He suggest a similar difficulty in establishing the sum rules there.

2020 ◽  
Vol 53 (4) ◽  
pp. 1108-1129 ◽  
Author(s):  
Victoria Savikhin ◽  
Hans-Georg Steinrück ◽  
Ru-Ze Liang ◽  
Brian A. Collins ◽  
Stefan D. Oosterhout ◽  
...  

Grazing-incidence wide-angle X-ray scattering (GIWAXS) has become an increasingly popular technique for quantitative structural characterization and comparison of thin films. For this purpose, accurate intensity normalization and peak position determination are crucial. At present, few tools exist to estimate the uncertainties of these measurements. Here, a simulation package is introduced called GIWAXS-SIIRkit, where SIIR stands for scattering intensity, indexing and refraction. The package contains several tools that are freely available for download and can be executed in MATLAB. The package includes three functionalities: estimation of the relative scattering intensity and the corresponding uncertainty based on experimental setup and sample dimensions; extraction and indexing of peak positions to approximate the crystal structure of organic materials starting from calibrated GIWAXS patterns; and analysis of the effects of refraction on peak positions. Each tool is based on a graphical user interface and designed to have a short learning curve. A user guide is provided with detailed usage instruction, tips for adding functionality and customization, and exemplary files.


1962 ◽  
Vol 6 ◽  
pp. 136-141
Author(s):  
F. R. L. Schoening ◽  
F. Witt

AbstractOxygen was introduced into a single crystal of titanium in successive stages. The intensities of the h00 and 00l reflections were measured with a single-crystal diffractometer. The observed variation of the intensities with oxygen concentration was attributed to three factors: (1) the additional scattering from the oxygen atoms, (2) a change in the Debye-Waller factor, and (3) an exponential factor originating from the distortion around the oxygen atom. The theory of X-ray scattering from crystals containing centers of distortion was applied to the hexagonal titanium containing interstitial oxygen atoms. Using the variation of the lattice constant with oxygen concentration, it was possible to predict the intensity reduction due to lattice strains. It was concluded that it would have been possible to obtain an estimate of the defect concentration from the X-ray measurements of lattice expansion and intensity reduction.


Langmuir ◽  
1991 ◽  
Vol 7 (9) ◽  
pp. 1895-1899
Author(s):  
Eric Y. Sheu ◽  
Sow Hsin. Chen ◽  
Bruce L. Carvalho ◽  
J. S. Lin ◽  
Malcolm. Capel

2021 ◽  
Vol 77 (1) ◽  
pp. 42-53
Author(s):  
Vladimir M. Kaganer ◽  
Oleg V. Konovalov ◽  
Sergio Fernández-Garrido

Small-angle X-ray scattering from GaN nanowires grown on Si(111) is measured in the grazing-incidence geometry and modelled by means of a Monte Carlo simulation that takes into account the orientational distribution of the faceted nanowires and the roughness of their side facets. It is found that the scattering intensity at large wavevectors does not follow Porod's law I(q) ∝ q −4. The intensity depends on the orientation of the side facets with respect to the incident X-ray beam. It is maximum when the scattering vector is directed along a facet normal, reminiscent of surface truncation rod scattering. At large wavevectors q, the scattering intensity is reduced by surface roughness. A root-mean-square roughness of 0.9 nm, which is the height of just 3–4 atomic steps per micrometre-long facet, already gives rise to a strong intensity reduction.


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