SURFACE POTENTIAL MEASUREMENT BY ATOMIC FORCE MICROSCOPY USING A QUARTZ RESONATOR

2006 ◽  
Author(s):  
SEIJI HEIKE ◽  
T. HASHIZUME
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Potential ◽  
Quartz Resonator ◽  
Potential Measurement ◽  
Force Microscopy ◽  
Atomic Force

Ultrasharp and high aspect ratio carbon nanotube atomic force microscopy probes for enhanced surface potential imaging

2008 ◽  
Vol 19 (23) ◽  
pp. 235704 ◽  
Author(s):  
Minhua Zhao ◽  
Vaneet Sharma ◽  
Haoyan Wei ◽  
Robert R Birge ◽  
Jeffrey A Stuart ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Aspect Ratio ◽  
Surface Potential ◽  
High Aspect Ratio ◽  
Force Microscopy ◽  
Atomic Force ◽  
Enhanced Surface

Membrane Knobs of UnfixedPlasmodium falciparumInfected Erythrocytes: New Findings as Revealed by Atomic Force Microscopy and Surface Potential Spectroscopy

1996 ◽  
Vol 84 (3) ◽  
pp. 339-343 ◽  
Author(s):  
Masamichi Aikawa ◽  
Kiyoshi Kamanura ◽  
Soshi Shiraishi ◽  
Yoshitugu Matsumoto ◽  
Henry Arwati ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Potential ◽  
Force Microscopy ◽  
Atomic Force ◽  
New Findings

Feed-forward compensation of surface potential in atomic force microscopy

2008 ◽  
Vol 79 (6) ◽  
pp. 063704 ◽  
Author(s):  
Dominik Ziegler ◽  
Nicola Naujoks ◽  
Andreas Stemmer
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Potential ◽  
Feed Forward ◽  
Force Microscopy ◽  
Atomic Force

Multifrequency Atomic Force Microscopy: Compositional Imaging with Electrostatic Force Measurements

2011 ◽  
Vol 17 (4) ◽  
pp. 587-597 ◽  
Author(s):  
Sergei Magonov ◽  
John Alexander
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Potential ◽  
Electrostatic Interactions ◽  
Electrostatic Force ◽  
Contact Mode ◽  
Organic Layers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Intermittent Contact ◽  
Multicomponent Polymer

AbstractWe demonstrate that single-pass Kelvin force microscopy (KFM) and dC/dz measurements in different environments expand the compositional imaging with atomic force microscopy. The KFM and dC/dz studies were performed in the intermittent contact mode with force gradient detection of tip-sample electrostatic interactions. Both factors contribute to sensitive measurements of the surface potential and capacitance gradient with nanometer-scale spatial resolution as it was verified on a broad range of materials: metal alloys, polymers, organic layers, and liquid-like objects. For many samples the surface potential and dC/dz variations complement each other in identification of individual components of heterogeneous materials. In situ imaging in different humidity or vapors of various organic solvents further facilitate recognition of the constituents of multicomponent polymer samples due to selective swelling of components.

Membrane knobs of unfixed Babesia bovis-infected erythrocytes: new findings as revealed by atomic force microscopy and surface potential spectroscopy

1997 ◽  
Vol 46 (4) ◽  
pp. 241-246 ◽  
Author(s):  
Masamichi Aikawa ◽  
Shin-ichiro Kawazu ◽  
Tujihiko Kamio ◽  
Yoshitsugu Matsumoto ◽  
Toshimitsu Naya ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Potential ◽  
Babesia Bovis ◽  
Force Microscopy ◽  
Atomic Force ◽  
New Findings
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