CHANNEL CONDUCTANCE OF ABA STACKING TRILAYER GRAPHENE NANORIBBON FIELD-EFFECT TRANSISTOR

2012 ◽  
Vol 26 (08) ◽  
pp. 1250047 ◽  
Author(s):  
HATEF SADEGHI ◽  
M. T. AHMADI ◽  
S. M. MOUSAVI ◽  
RAZALI ISMAIL ◽  
MAHDIAR H. GHADIRY

In this paper, our focus is on ABA trilayer graphene nanoribbon (TGN), in which the middle layer is horizontally shifted from the top and bottom layers. The conductance model of TGN as a FET channel is presented based on Landauer formula. Besides the good reported agreement with experimental study lending support to our model, the presented model demonstrates that minimum conductivity increases dramatically by temperature. It also draws parallels between TGN and bilayer graphene nanoribbon, in which similar thermal behavior is observed. Maxwell–Boltzmann approximation is employed to form the conductance of TGN near the neutrality point. Analytical model in degenerate regime in comparison with reported data proves that TGN-based transistor will operate in degenerate regime like what we expect in conventional semiconductors. Moreover, our model confirms that in similar condition, the conductivity of TGN is less than bilayer graphene nanoribbon as reported in some experiments.

2013 ◽  
Vol 10 (3) ◽  
pp. 738-741 ◽  
Author(s):  
S. Mahdi Mousavi ◽  
M. Taghi Ahmadi ◽  
Azadeh Nilghaz ◽  
Javad Samadi ◽  
M. Javad Kiani ◽  
...  

2014 ◽  
Vol 6 (4) ◽  
pp. 633-639 ◽  
Author(s):  
Meisam Rahmani ◽  
Razali Ismail ◽  
Mohammad Taghi Ahmadi ◽  
Mohammad Javad Kiani ◽  
Komeil Rahmani

2011 ◽  
Author(s):  
S. M. Mousavi ◽  
M. T. Ahmadi ◽  
J. F. Webb ◽  
H. Sadeghi ◽  
A. Nilghaz ◽  
...  

2018 ◽  
pp. 207-238
Author(s):  
Meisam Rahmani ◽  
Hatef Sadeghi ◽  
Seyed Mahdi Mousavi ◽  
Mohammad Taghi Ahmadi ◽  
Razali Ismail

Author(s):  
Meisam Rahmani ◽  
Razali Ismail ◽  
Mohammad Taghi Ahmadi ◽  
Komeil Rahmani ◽  
Ali H. Pourasl

Electronics ◽  
2019 ◽  
Vol 8 (8) ◽  
pp. 851 ◽  
Author(s):  
Gil-Tomàs ◽  
Gracia-Morán ◽  
Saiz-Adalid ◽  
Gil-Vicente

Due to the increasing defect rates in highly scaled complementary metal–oxide–semiconductor (CMOS) devices, and the emergence of alternative nanotechnology devices, reliability challenges are of growing importance. Understanding and controlling the fault mechanisms associated with new materials and structures for both transistors and interconnection is a key issue in novel nanodevices. The graphene nanoribbon field-effect transistor (GNR FET) has revealed itself as a promising technology to design emerging research logic circuits, because of its outstanding potential speed and power properties. This work presents a study of fault causes, mechanisms, and models at the device level, as well as their impact on logic circuits based on GNR FETs. From a literature review of fault causes and mechanisms, fault propagation was analyzed, and fault models were derived for device and logic circuit levels. This study may be helpful for the prevention of faults in the design process of graphene nanodevices. In addition, it can help in the design and evaluation of defect- and fault-tolerant nanoarchitectures based on graphene circuits. Results are compared with other emerging devices, such as carbon nanotube (CNT) FET and nanowire (NW) FET.


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