Thermal-Aware Task Scheduling for 3D-Network-on-Chip: A Bottom to Top Scheme

2015 ◽  
Vol 25 (01) ◽  
pp. 1640003 ◽  
Author(s):  
Yingnan Cui ◽  
Wei Zhang ◽  
Vivek Chaturvedi ◽  
Weichen Liu ◽  
Bingsheng He

Three-dimensional network-on-chip (3D-NoC) emerges as a potential multi-core architecture delivering high performance, high energy efficiency and great scalability. However, 3D-NoC suffers from severe thermal problems due to its high power density. To solve this problem, thermal-aware scheduling is an effective solution. However, the high complexity of the thermal model of 3D-NoC becomes a major hurdle for developing efficient thermal-aware scheduling algorithms for 3D-NoC. In this paper, we propose a novel thermal-aware task scheduling scheme named as the Bottom-to-Top (B2T) approach to address this challenge. This heuristic-based method performs task allocation on processing units to efficiently minimize the peak temperature and improve the execution time of the tasks with low complexity. The algorithm is first designed for two-layer 3D-NoC and then extended to 3D-NoC with an arbitrary number of layers. When compared to traditional thermal-aware scheduling algorithms designed for 2D-NoC, our B2T algorithm can achieve significant peak temperature reduction (up to 11.9[Formula: see text]C) and performance improvement (up to 4%) on two-layer 3D-NoC. The improvement becomes more significant as the number of layers in 3D-NoC increases. For four-layer 3D-NoC, the improvement is up to [Formula: see text]C peak temperature reduction.

Author(s):  
Konstantinos Tatas ◽  
Kostas Siozios ◽  
Dimitrios Soudris ◽  
Axel Jantsch
Keyword(s):  
On Chip ◽  

2013 ◽  
Vol 12 (23) ◽  
pp. 7297-7304 ◽  
Author(s):  
Ge Fen ◽  
Feng Gui ◽  
Yu Shuang ◽  
Wu Ning
Keyword(s):  

2010 ◽  
Vol 2010 (1) ◽  
pp. 000015-000022
Author(s):  
Paul Enquist

3D microelectronics integration and wafer scale packaging promise improvements in functional density and cost compared to conventional 2D microelectronics and packaging technologies. The realization of these improvements will require further adoption of 3D volume manufacturing process technologies. These process technologies will likely include through silicon via (TSV) and die or wafer bonding with and without 3D interconnect. Low temperature direct bond technologies have a number of inherent performance and cost advantages compared to other bonding technologies. This paper describes low temperature direct oxide bond technologies with and without a scalable 3D interconnect developed by Ziptronix and cost savings, performance and applications that will be enabled by adoption of these technologies. Enabled cost savings and performance include system or network-on-chip, system in package, and TSVs. Enabled applications include backside illuminated image sensors, micron-scale pitch vertically integrated image sensor arrays, 3D system-on-chip and 3D network-on-chip.


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