PEEM AND SXES CHARACTERIZATION ON THE SURFACE AND INTERFACE OF THE TRANSITION-METAL/SiC SYSTEM

2002 ◽  
Vol 09 (01) ◽  
pp. 313-318
Author(s):  
JOSELITO LABIS ◽  
AKIHIKO OHI ◽  
CHIHIRO KAMEZAWA ◽  
TOSHINORI FUJIKI ◽  
KENICHI YOSHIDA ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Heat Treatment ◽  
Transition Metal ◽  
Emission Spectroscopy ◽  
Emission Spectra ◽  
Photoemission Electron Microscopy ◽  
X Ray ◽  
Surface And Interface ◽  
Photoemission Electron

The Si L2,3 and C K soft X-ray emission spectra of the interface of the Ti(50 nm)/4H-SiC(substrate) system, thermally annealed from 800°C to 1000°C and characterized by soft X-ray emission spectroscopy (SXES), revealed the formation of a reacted region composed of silicides with Ti 5 Si 3 as the majority formed species and carbides in TiC-like bonding. Also, the photoemission electron microscopy (PEEM) imaging of Ti(10 nm) film on 3C-SiC surface during in situ heat treatment showed the formation of island structures (in ring clusters) at ~ 800°C.

In situ magnetic and electronic investigation of the early stage oxidation of Fe nanoparticles using X-ray photo-emission electron microscopy

2014 ◽  
Vol 16 (48) ◽  
pp. 26624-26630 ◽  
Author(s):  
C. A. F. Vaz ◽  
A. Balan ◽  
F. Nolting ◽  
A. Kleibert
Keyword(s):  
Electron Microscopy ◽  
Chemical Composition ◽  
Iron Nanoparticles ◽  
Early Stage ◽  
Photoemission Electron Microscopy ◽  
X Ray ◽  
Emission Electron ◽  
Fe Nanoparticles ◽  
Photoemission Electron

In situX-ray photoemission electron microscopy reveals the evolution of chemical composition and magnetism of individual iron nanoparticles during oxidation.

Surface and interface of Ti(film)/SiC(substrate) system: a soft X-ray emission and photoemission electron microscopy study

2002 ◽  
Vol 190 (1-4) ◽  
pp. 521-526 ◽  
Author(s):  
Joselito Labis ◽  
Akihiko Ohi ◽  
Chihiro Kamezawa ◽  
Kenichi Yoshida ◽  
Masaaki Hirai ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Photoemission Electron Microscopy ◽  
X Ray ◽  
Surface And Interface ◽  
System A ◽  
Photoemission Electron

Surface Reactions of Metal Catalysts for Carbon Nanotubes on an Oxide Thin Layer/Si Substrates Studied by in-situ Micro X-ray Adsorption Spectroscopy using SPELEEM

2006 ◽  
Vol 967 ◽  
Author(s):  
Fumihiko Maeda ◽  
Hiroki Hibino ◽  
Satoru Suzuki ◽  
FangZhun Guo ◽  
Yoshio Watanabe
Keyword(s):  
Electron Microscopy ◽  
Oxide Layer ◽  
X Ray ◽  
Si Substrates ◽  
Microscopy Image ◽  
Special Surface ◽  
Void Area ◽  
Low Energy Electron ◽  
Photoemission Electron

ABSTRACTTo clarify the reaction process of Co and Fe with a oxide layer on Si substrates, the annealing processes were analyzed using spectroscopic photoemission and low-energy electron microscopy for a special surface where oxide areas and clean substrate areas (voids) coexist closely in a micrometer-order view. From analyses of XAS spectra and edge jump ratios obtained from the photoemission electron microscopy image, we clarified that Co atoms in the void area remain because of the formation of silicides, but that those on the oxide layer disappear because metallic Co atoms easily diffuse. In contrast, in the case of Fe, we found the formation of various silicides and their gradual diffusion into Si substrate even in the form of silicides.

Nanoscale chemical imaging of the additive effects on the interfaces of high-voltage LiCoO2 composite electrodes

2017 ◽  
Vol 53 (61) ◽  
pp. 8581-8584 ◽  
Author(s):  
Jian Wang ◽  
Yajuan Ji ◽  
Narayana Appathurai ◽  
Jigang Zhou ◽  
Yong Yang
Keyword(s):  
Electron Microscopy ◽  
High Voltage ◽  
Chemical Imaging ◽  
Additive Effects ◽  
Composite Electrodes ◽  
Photoemission Electron Microscopy ◽  
X Ray ◽  
Multiple Components ◽  
Nanoscale Chemical Imaging ◽  
Photoemission Electron

X-ray photoemission electron microscopy (X-PEEM) of cycled LiCoO2 composite electrodes has revealed the interfaces of various components within the composite electrodes and their dependence on additives in the electrolyte and the interplay of multiple components in the electrodes.

Spatially Resolved X-ray Photoemission Electron Microscopy of Weyl Semimetal NbAs

2018 ◽  
Vol 18 (9) ◽  
pp. 5210-5213 ◽  
Author(s):  
Hongwen Liu ◽  
Guanhua Zhang ◽  
Pierre Richard ◽  
Lingxiao Zhao ◽  
Gen-Fu Chen ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Photoemission Electron Microscopy ◽  
X Ray ◽  
Spatially Resolved ◽  
Weyl Semimetal ◽  
Photoemission Electron
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