Regression conditions that characterize free-Poisson and free-Kummer distributions

2021 ◽  
pp. 2250019
Author(s):  
Agnieszka Piliszek
Keyword(s):  
Spectral Distribution ◽  
Random Variables ◽  
Independence Property ◽  
Wishart Matrices

We find the asymptotic spectral distribution of random Kummer matrix. Then we formulate and prove a free analogue of HV independence property, which is known for classical Kummer and Gamma random variables and for Kummer and Wishart matrices. We also prove a related characterization of free-Kummer and free-Poisson (Marchenko–Pastur) non-commutative random variables.

scholarly journals HEYDE’S CHARACTERIZATION THEOREM FOR DISCRETE ABELIAN GROUPS

2010 ◽  
Vol 88 (1) ◽  
pp. 93-102 ◽  
Author(s):  
MARGARYTA MYRONYUK
Keyword(s):  
Abelian Group ◽  
Automorphism Group ◽  
Real Line ◽  
Linear Form ◽  
Conditional Distribution ◽  
Random Variables ◽  
Characterization Theorem ◽  
Gaussian Distributions ◽  
Discrete Abelian Group

AbstractLet X be a countable discrete abelian group with automorphism group Aut(X). Let ξ1 and ξ2 be independent X-valued random variables with distributions μ1 and μ2, respectively. Suppose that α1,α2,β1,β2∈Aut(X) and β1α−11±β2α−12∈Aut(X). Assuming that the conditional distribution of the linear form L2 given L1 is symmetric, where L2=β1ξ1+β2ξ2 and L1=α1ξ1+α2ξ2, we describe all possibilities for the μj. This is a group-theoretic analogue of Heyde’s characterization of Gaussian distributions on the real line.

A characterization of the negative exponential distribution with application to reliability theory

1981 ◽  
Vol 18 (3) ◽  
pp. 652-659 ◽  
Author(s):  
M. J. Phillips
Keyword(s):  
Exponential Distribution ◽  
Random Variables ◽  
Reliability Theory ◽  
The Other ◽  
Independent Random Variables ◽  
System Availability ◽  
Failure Times ◽  
Negative Exponential Distribution ◽  
Negative Exponential

The negative exponential distribution is characterized in terms of two independent random variables. Only one of the random variables has a negative exponential distribution whilst the other can belong to a wide class of distributions. This result is then applied to two models for the reliability of a system of two modules subject to revealed and unrevealed faults to show when the models are equivalent. It is also shown, under certain conditions, that the system availability is only independent of the distribution of revealed failure times in one module when unrevealed failure times in the other module have a negative exponential distribution.

Some new approaches to probability distributions

1980 ◽  
Vol 12 (04) ◽  
pp. 903-921 ◽  
Author(s):  
S. Kotz ◽  
D. N. Shanbhag
Keyword(s):  
Probability Distributions ◽  
Random Variables ◽  
Representation Theorems ◽  
Practical Applications ◽  
New Approaches ◽  
Characterization Of Distributions ◽  
Stability Theorems ◽  
Conditional Expectations

We develop some approaches to the characterization of distributions of real-valued random variables, useful in practical applications, in terms of conditional expectations and hazard measures. We prove several representation theorems generalizing earlier results, and establish stability theorems for two general characteristics introduced in this paper.

On Characterization of Distributions of Symmetrically Dependent Random Variables

2020 ◽  
Vol 244 (5) ◽  
pp. 752-761
Author(s):  
I. V. Volchenkova ◽  
L. B. Klebanov
Keyword(s):  
Random Variables ◽  
Dependent Random Variables ◽  
Characterization Of Distributions

scholarly journals Lévy type characterization of stable laws for free random variables

1995 ◽  
Vol 347 (7) ◽  
pp. 2457-2472
Author(s):  
Vittorino Pata
Keyword(s):  
Random Variables ◽  
Stable Laws ◽  
Free Random Variables

Measurement system for characterization of angular and spectral distribution of LED-based sources

2018 ◽  
Author(s):  
Mojmír Šerý ◽  
Jan Ježek ◽  
Petr Jákl ◽  
Marek Škereň ◽  
Pavel Zemánek
Keyword(s):  
Measurement System ◽  
Spectral Distribution

Characterization of distributions by the identical distribution of linear forms

1966 ◽  
Vol 3 (02) ◽  
pp. 481-494 ◽  
Author(s):  
Morris L. Eaton
Keyword(s):  
Random Variables ◽  
Linear Forms ◽  
Characterization Of Distributions ◽  
Identical Distribution ◽  
The Law

Throughout this paper, we shall write ℒ(W) = ℒ(Z) to mean the random variables W and Z have the same distribution. The relation “ℒ(W) = ℒ(;Z)” reads “the law of W equals the law of Z”.

A joint characterization of the multinomial distribution and the Poisson process

1983 ◽  
Vol 20 (01) ◽  
pp. 202-208 ◽  
Author(s):  
George Kimeldorf ◽  
Peter F. Thall
Keyword(s):  
Poisson Process ◽  
Present Article ◽  
Point Process ◽  
Random Variables ◽  
Multinomial Distribution ◽  
Process Theory ◽  
Independent Random Variables ◽  
Mutually Independent

It has been recently proved that if N, X 1, X 2, … are non-constant mutually independent random variables with X 1,X 2, … identically distributed and N non-negative and integer-valued, then the independence of and implies that X 1 is Bernoulli and N is Poisson. A well-known theorem in point process theory due to Fichtner characterizes a Poisson process in terms of a sum of independent thinnings. In the present article, simultaneous generalizations of both of these results are provided, including a joint characterization of the multinomial distribution and the Poisson process.

A characterization of the negative exponential distribution with application to reliability theory

1981 ◽  
Vol 18 (03) ◽  
pp. 652-659 ◽  
Author(s):  
M. J. Phillips
Keyword(s):  
Exponential Distribution ◽  
Random Variables ◽  
Reliability Theory ◽  
The Other ◽  
Independent Random Variables ◽  
System Availability ◽  
Failure Times ◽  
Negative Exponential Distribution ◽  
Negative Exponential

The negative exponential distribution is characterized in terms of two independent random variables. Only one of the random variables has a negative exponential distribution whilst the other can belong to a wide class of distributions. This result is then applied to two models for the reliability of a system of two modules subject to revealed and unrevealed faults to show when the models are equivalent. It is also shown, under certain conditions, that the system availability is only independent of the distribution of revealed failure times in one module when unrevealed failure times in the other module have a negative exponential distribution.

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