Structural Properties of Silicon Oxide Films Prepared by the RF Substrate Biased ECR Plasma CVD Method
1989 ◽
Vol 28
(Part 2, No. 6)
◽
pp. L1048-L1050
◽
Keyword(s):
1994 ◽
Vol 45
(12)
◽
pp. 1270-1275
Keyword(s):
1988 ◽
Vol 27
(Part 2, No. 10)
◽
pp. L1962-L1965
◽
Keyword(s):
1991 ◽
Vol 111
(12)
◽
pp. 1064-1070
Keyword(s):
Annealing behavior of silicon nitride and silicon oxynitride films prepared by ECR plasma CVD method
1988 ◽
Vol 33-34
◽
pp. 1094-1100
◽
Keyword(s):
1988 ◽
Vol 27
(Part 1, No. 12)
◽
pp. 2192-2198
◽
1987 ◽
Vol 26
(Part 2, No. 5)
◽
pp. L544-L546
◽
1990 ◽
Vol 5
(4)
◽
pp. 361-363
◽
1990 ◽
Vol 29
(Part 2, No. 10)
◽
pp. L1753-L1756
◽