Optical Transitions via the Structure-Defect Levels Due to Lattice Vacancies in InSb

1991 ◽  
Vol 30 (Part 1, No. 6) ◽  
pp. 1169-1175 ◽  
Author(s):  
Jun-Yuan Chen ◽  
Jenn-Gee Lo ◽  
Luke Su Lu
1971 ◽  
Vol 32 (C1) ◽  
pp. C1-932-C1-933 ◽  
Author(s):  
H. W. LEHMANN ◽  
G. HARBEKE ◽  
H. PINCH

1984 ◽  
Vol 45 (C8) ◽  
pp. C8-57-C8-60 ◽  
Author(s):  
M. Hanfland ◽  
K. Syassen ◽  
N. E. Christensen

2020 ◽  
Vol 35 (22) ◽  
pp. 3041-3047
Author(s):  
Lingyan Xu ◽  
Yan Zhou ◽  
Xu Fu ◽  
Lu Liang ◽  
Wanqi Jie

Abstract


2021 ◽  
Vol 271 ◽  
pp. 115238
Author(s):  
Rihani Jawher ◽  
Radhwen Chtourou ◽  
Vincent Sallet ◽  
Mehrez Oueslati

2008 ◽  
Vol 2008 ◽  
pp. 1-4
Author(s):  
Dmitry E. Milovzorov

The structural, optical, and conductivity properties of silicon film deposited on cerium dioxide buffer layer were studied. The electronic structure of system consists of various defect levels inside band gap. The temperature spatial distribution plays a great role in silicon crystallization. The field destruction of crystal phase and its restoration, after annealing, were investigated.


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