Superstructures Induced by Ni Adsorption on a Clean Si(110) Surface Studied by Reflection High-Energy Electron Diffraction-Total Reflection Angle X-Ray Spectroscopy

Youiti Yamamoto

doi:10.1143/jjap.31.2544

Superstructures Induced by Ni Adsorption on a Clean Si(110) Surface Studied by Reflection High-Energy Electron Diffraction-Total Reflection Angle X-Ray Spectroscopy

Japanese Journal of Applied Physics ◽

10.1143/jjap.31.2544 ◽

1992 ◽

Vol 31 (Part 1, No. 8) ◽

pp. 2544-2549 ◽

Cited By ~ 9

Author(s):

Youiti Yamamoto

Keyword(s):

Electron Diffraction ◽

High Energy ◽

Total Reflection ◽

Energy Electron ◽

High Energy Electron ◽

X Ray ◽

Reflection Angle

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Measurement of Glancing Incidence-Exit X-ray Scattering in Reflection High Energy Electron Diffraction and Total-Reflection-Angle X-ray Spectroscopy System

Japanese Journal of Applied Physics ◽

10.1143/jjap.35.5553 ◽

1996 ◽

Vol 35 (Part 1, No. 10) ◽

pp. 5553-5557 ◽

Cited By ~ 2

Author(s):

Ziyuan Liu ◽

Seiya Ogota ◽

Tadataka Morishita

Keyword(s):

Electron Diffraction ◽

High Energy ◽

Total Reflection ◽

Energy Electron ◽

High Energy Electron ◽

X Ray ◽

X Ray Scattering ◽

Reflection Angle ◽

Spectroscopy System ◽

Ray Scattering

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Glancing Angle Dependence of the X-Ray Emission Measured under Total Reflection Angle X-Ray Spectroscopy (TRAXS) Condition during Reflection High Energy Electron Diffraction Observation

Japanese Journal of Applied Physics ◽

10.1143/jjap.31.l1503 ◽

1992 ◽

Vol 31 (Part 2, No. 10B) ◽

pp. L1503-L1505 ◽

Cited By ~ 10

Author(s):

Toshiro Yamanaka ◽

Takashi Hanada ◽

Shozo Ino ◽

Hiroshi Daimon

Keyword(s):

Electron Diffraction ◽

High Energy ◽

Total Reflection ◽

Energy Electron ◽

High Energy Electron ◽

X Ray ◽

Angle Dependence ◽

Reflection Angle ◽

Glancing Angle

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In SituX-Ray Chemical Analysis of Y1Ba2Cu3O7-xFilms by Reflection-High-Energy-Electron-Diffraction Total-Reflection-Angle X-Ray Spectroscopy

Japanese Journal of Applied Physics ◽

10.1143/jjap.31.1326 ◽

1992 ◽

Vol 31 (Part 1, No. 5A) ◽

pp. 1326-1328 ◽

Cited By ~ 12

Author(s):

Masayuki Kamei ◽

Yuji Aoki ◽

Toshio Usui ◽

Tadataka Morishita

Keyword(s):

Electron Diffraction ◽

Chemical Analysis ◽

High Energy ◽

Total Reflection ◽

Energy Electron ◽

High Energy Electron ◽

X Ray ◽

Reflection Angle

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An apparatus for beam-rocking reflection high-energy electron diffraction and total reflection angle x-ray spectroscopy

Review of Scientific Instruments ◽

10.1063/1.1337070 ◽

2001 ◽

Vol 72 (2) ◽

pp. 1477 ◽

Cited By ~ 6

Author(s):

Toshiro Yamanaka ◽

Shozo Ino

Keyword(s):

Electron Diffraction ◽

High Energy ◽

Total Reflection ◽

Energy Electron ◽

High Energy Electron ◽

X Ray ◽

Reflection Angle

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Study of Epitaxy by RHEED(Reflection High Energy Electron Diffraction)-TRAXS(Total Reflection Angle X-Ray Spectroscopy).

Analytical Sciences ◽

10.2116/analsci.11.539 ◽

1995 ◽

Vol 11 (3) ◽

pp. 539-543 ◽

Cited By ~ 2

Author(s):

Shozo INO

Keyword(s):

Electron Diffraction ◽

High Energy ◽

Total Reflection ◽

Energy Electron ◽

High Energy Electron ◽

X Ray ◽

Reflection Angle

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Atomic layer epitaxy processes of ZnSe on GaAs(001) as observed by beam-rocking reflection high-energy electron diffraction (RHEED) and total-reflection-angle X-ray spectroscopy (TRAXS)

Journal of Crystal Growth ◽

10.1016/s0022-0248(98)01383-9 ◽

1999 ◽

Vol 201-202 ◽

pp. 490-493 ◽

Cited By ~ 5

Author(s):

Akihiro Ohtake ◽

Takashi Hanada ◽

Kenta Arai ◽

Takuji Komura ◽

Shiro Miwa ◽

...

Keyword(s):

Electron Diffraction ◽

Atomic Layer ◽

High Energy ◽

Total Reflection ◽

Energy Electron ◽

Atomic Layer Epitaxy ◽

High Energy Electron ◽

X Ray ◽

Reflection Angle

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In situ observation of the growth process of the InAsGaAs heteroepitaxial system using scanning microprobe reflection high energy electron diffraction-total reflection angle X-ray spectroscopy

Thin Solid Films ◽

10.1016/0040-6090(93)90554-3 ◽

1993 ◽

Vol 228 (1-2) ◽

pp. 18-22 ◽

Cited By ~ 2

Author(s):

S. Shimizu ◽

K. Yamamuro ◽

K. Fuwa ◽

H. Yanagida ◽

H. Yamakawa ◽

...

Keyword(s):

Electron Diffraction ◽

Growth Process ◽

High Energy ◽

Total Reflection ◽

Energy Electron ◽

In Situ Observation ◽

High Energy Electron ◽

X Ray ◽

Reflection Angle

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Study of a Si(110) surface by using reflection high-energy electron diffraction-total reflection angle X-ray spectroscopy and high temperature scanning tunneling microscopy

Surface Science ◽

10.1016/0039-6028(94)91163-0 ◽

1994 ◽

Vol 313 (1-2) ◽

pp. 155-167 ◽

Cited By ~ 41

Author(s):

Youiti Yamamoto

Keyword(s):

High Temperature ◽

Electron Diffraction ◽

High Energy ◽

Total Reflection ◽

Scanning Tunneling ◽

High Energy Electron ◽

Tunneling Microscopy ◽

X Ray ◽

Reflection Angle ◽

Temperature Scanning

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Isothermal adsorption and desorption studies of In/Si() by reflection high energy electron diffraction and fluorescent X-ray spectroscopy

Surface Science ◽

10.1016/s0039-6028(02)02544-x ◽

2003 ◽

Vol 524 (1-3) ◽

pp. 199-205 ◽

Cited By ~ 9

Author(s):

N. Minami ◽

Y. Machida ◽

T. Kajikawa ◽

T. Sato ◽

K. Ota ◽

...

Keyword(s):

Electron Diffraction ◽

High Energy ◽

Energy Electron ◽

High Energy Electron ◽

Isothermal Adsorption ◽

Adsorption And Desorption ◽

X Ray

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Multiple scattering X-ray photoelectron diffraction calculations using reflection high energy electron diffraction theory

Surface Science ◽

10.1016/s0039-6028(99)00016-3 ◽

1999 ◽

Vol 424 (1) ◽

pp. 94-108 ◽

Cited By ~ 2

Author(s):

J.F. Hart ◽

J.L. Beeby

Keyword(s):

Electron Diffraction ◽

Multiple Scattering ◽

Diffraction Theory ◽

High Energy ◽

Energy Electron ◽

High Energy Electron ◽

X Ray ◽

Photoelectron Diffraction

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