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Study of Epitaxy by RHEED(Reflection High Energy Electron Diffraction)-TRAXS(Total Reflection Angle X-Ray Spectroscopy).
Analytical Sciences
◽
10.2116/analsci.11.539
◽
1995
◽
Vol 11
(3)
◽
pp. 539-543
◽
Cited By ~ 2
Author(s):
Shozo INO
Keyword(s):
Electron Diffraction
◽
High Energy
◽
Total Reflection
◽
Energy Electron
◽
High Energy Electron
◽
X Ray
◽
Reflection Angle
Download Full-text
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Cited By
References
Measurement of Glancing Incidence-Exit X-ray Scattering in Reflection High Energy Electron Diffraction and Total-Reflection-Angle X-ray Spectroscopy System
Japanese Journal of Applied Physics
◽
10.1143/jjap.35.5553
◽
1996
◽
Vol 35
(Part 1, No. 10)
◽
pp. 5553-5557
◽
Cited By ~ 2
Author(s):
Ziyuan Liu
◽
Seiya Ogota
◽
Tadataka Morishita
Keyword(s):
Electron Diffraction
◽
High Energy
◽
Total Reflection
◽
Energy Electron
◽
High Energy Electron
◽
X Ray
◽
X Ray Scattering
◽
Reflection Angle
◽
Spectroscopy System
◽
Ray Scattering
Download Full-text
Glancing Angle Dependence of the X-Ray Emission Measured under Total Reflection Angle X-Ray Spectroscopy (TRAXS) Condition during Reflection High Energy Electron Diffraction Observation
Japanese Journal of Applied Physics
◽
10.1143/jjap.31.l1503
◽
1992
◽
Vol 31
(Part 2, No. 10B)
◽
pp. L1503-L1505
◽
Cited By ~ 10
Author(s):
Toshiro Yamanaka
◽
Takashi Hanada
◽
Shozo Ino
◽
Hiroshi Daimon
Keyword(s):
Electron Diffraction
◽
High Energy
◽
Total Reflection
◽
Energy Electron
◽
High Energy Electron
◽
X Ray
◽
Angle Dependence
◽
Reflection Angle
◽
Glancing Angle
Download Full-text
In SituX-Ray Chemical Analysis of Y1Ba2Cu3O7-xFilms by Reflection-High-Energy-Electron-Diffraction Total-Reflection-Angle X-Ray Spectroscopy
Japanese Journal of Applied Physics
◽
10.1143/jjap.31.1326
◽
1992
◽
Vol 31
(Part 1, No. 5A)
◽
pp. 1326-1328
◽
Cited By ~ 12
Author(s):
Masayuki Kamei
◽
Yuji Aoki
◽
Toshio Usui
◽
Tadataka Morishita
Keyword(s):
Electron Diffraction
◽
Chemical Analysis
◽
High Energy
◽
Total Reflection
◽
Energy Electron
◽
High Energy Electron
◽
X Ray
◽
Reflection Angle
Download Full-text
An apparatus for beam-rocking reflection high-energy electron diffraction and total reflection angle x-ray spectroscopy
Review of Scientific Instruments
◽
10.1063/1.1337070
◽
2001
◽
Vol 72
(2)
◽
pp. 1477
◽
Cited By ~ 6
Author(s):
Toshiro Yamanaka
◽
Shozo Ino
Keyword(s):
Electron Diffraction
◽
High Energy
◽
Total Reflection
◽
Energy Electron
◽
High Energy Electron
◽
X Ray
◽
Reflection Angle
Download Full-text
Superstructures Induced by Ni Adsorption on a Clean Si(110) Surface Studied by Reflection High-Energy Electron Diffraction-Total Reflection Angle X-Ray Spectroscopy
Japanese Journal of Applied Physics
◽
10.1143/jjap.31.2544
◽
1992
◽
Vol 31
(Part 1, No. 8)
◽
pp. 2544-2549
◽
Cited By ~ 9
Author(s):
Youiti Yamamoto
Keyword(s):
Electron Diffraction
◽
High Energy
◽
Total Reflection
◽
Energy Electron
◽
High Energy Electron
◽
X Ray
◽
Reflection Angle
Download Full-text
Atomic layer epitaxy processes of ZnSe on GaAs(001) as observed by beam-rocking reflection high-energy electron diffraction (RHEED) and total-reflection-angle X-ray spectroscopy (TRAXS)
Journal of Crystal Growth
◽
10.1016/s0022-0248(98)01383-9
◽
1999
◽
Vol 201-202
◽
pp. 490-493
◽
Cited By ~ 5
Author(s):
Akihiro Ohtake
◽
Takashi Hanada
◽
Kenta Arai
◽
Takuji Komura
◽
Shiro Miwa
◽
...
Keyword(s):
Electron Diffraction
◽
Atomic Layer
◽
High Energy
◽
Total Reflection
◽
Energy Electron
◽
Atomic Layer Epitaxy
◽
High Energy Electron
◽
X Ray
◽
Reflection Angle
Download Full-text
In situ observation of the growth process of the InAsGaAs heteroepitaxial system using scanning microprobe reflection high energy electron diffraction-total reflection angle X-ray spectroscopy
Thin Solid Films
◽
10.1016/0040-6090(93)90554-3
◽
1993
◽
Vol 228
(1-2)
◽
pp. 18-22
◽
Cited By ~ 2
Author(s):
S. Shimizu
◽
K. Yamamuro
◽
K. Fuwa
◽
H. Yanagida
◽
H. Yamakawa
◽
...
Keyword(s):
Electron Diffraction
◽
Growth Process
◽
High Energy
◽
Total Reflection
◽
Energy Electron
◽
In Situ Observation
◽
High Energy Electron
◽
X Ray
◽
Reflection Angle
Download Full-text
Study of a Si(110) surface by using reflection high-energy electron diffraction-total reflection angle X-ray spectroscopy and high temperature scanning tunneling microscopy
Surface Science
◽
10.1016/0039-6028(94)91163-0
◽
1994
◽
Vol 313
(1-2)
◽
pp. 155-167
◽
Cited By ~ 41
Author(s):
Youiti Yamamoto
Keyword(s):
High Temperature
◽
Electron Diffraction
◽
High Energy
◽
Total Reflection
◽
Scanning Tunneling
◽
High Energy Electron
◽
Tunneling Microscopy
◽
X Ray
◽
Reflection Angle
◽
Temperature Scanning
Download Full-text
Isothermal adsorption and desorption studies of In/Si() by reflection high energy electron diffraction and fluorescent X-ray spectroscopy
Surface Science
◽
10.1016/s0039-6028(02)02544-x
◽
2003
◽
Vol 524
(1-3)
◽
pp. 199-205
◽
Cited By ~ 9
Author(s):
N. Minami
◽
Y. Machida
◽
T. Kajikawa
◽
T. Sato
◽
K. Ota
◽
...
Keyword(s):
Electron Diffraction
◽
High Energy
◽
Energy Electron
◽
High Energy Electron
◽
Isothermal Adsorption
◽
Adsorption And Desorption
◽
X Ray
Download Full-text
Multiple scattering X-ray photoelectron diffraction calculations using reflection high energy electron diffraction theory
Surface Science
◽
10.1016/s0039-6028(99)00016-3
◽
1999
◽
Vol 424
(1)
◽
pp. 94-108
◽
Cited By ~ 2
Author(s):
J.F. Hart
◽
J.L. Beeby
Keyword(s):
Electron Diffraction
◽
Multiple Scattering
◽
Diffraction Theory
◽
High Energy
◽
Energy Electron
◽
High Energy Electron
◽
X Ray
◽
Photoelectron Diffraction
Download Full-text
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