Atomic layer epitaxy processes of ZnSe on GaAs(001) as observed by beam-rocking reflection high-energy electron diffraction (RHEED) and total-reflection-angle X-ray spectroscopy (TRAXS)

Measurement of Glancing Incidence-Exit X-ray Scattering in Reflection High Energy Electron Diffraction and Total-Reflection-Angle X-ray Spectroscopy System

10.1143/jjap.35.5553 ◽

1996 ◽

Vol 35 (Part 1, No. 10) ◽

pp. 5553-5557 ◽

Cited By ~ 2

Author(s):

Ziyuan Liu ◽

Seiya Ogota ◽

Tadataka Morishita

Keyword(s):

Electron Diffraction ◽

High Energy ◽

Total Reflection ◽

Energy Electron ◽

High Energy Electron ◽

X Ray ◽

X Ray Scattering ◽

Reflection Angle ◽

Spectroscopy System ◽

Ray Scattering

Glancing Angle Dependence of the X-Ray Emission Measured under Total Reflection Angle X-Ray Spectroscopy (TRAXS) Condition during Reflection High Energy Electron Diffraction Observation

10.1143/jjap.31.l1503 ◽

1992 ◽

Vol 31 (Part 2, No. 10B) ◽

pp. L1503-L1505 ◽

Cited By ~ 10

Author(s):

Toshiro Yamanaka ◽

Takashi Hanada ◽

Shozo Ino ◽

Hiroshi Daimon

Keyword(s):

Electron Diffraction ◽

High Energy ◽

Total Reflection ◽

Energy Electron ◽

High Energy Electron ◽

X Ray ◽

Angle Dependence ◽

Reflection Angle ◽

Glancing Angle

In SituX-Ray Chemical Analysis of Y1Ba2Cu3O7-xFilms by Reflection-High-Energy-Electron-Diffraction Total-Reflection-Angle X-Ray Spectroscopy

10.1143/jjap.31.1326 ◽

1992 ◽

Vol 31 (Part 1, No. 5A) ◽

pp. 1326-1328 ◽

Cited By ~ 12

Author(s):

Masayuki Kamei ◽

Yuji Aoki ◽

Toshio Usui ◽

Tadataka Morishita

Keyword(s):

Electron Diffraction ◽

Chemical Analysis ◽

High Energy ◽

Total Reflection ◽

Energy Electron ◽

High Energy Electron ◽

X Ray ◽

An apparatus for beam-rocking reflection high-energy electron diffraction and total reflection angle x-ray spectroscopy

Review of Scientific Instruments ◽

10.1063/1.1337070 ◽

2001 ◽

Vol 72 (2) ◽

pp. 1477 ◽

Cited By ~ 6

Author(s):

Toshiro Yamanaka ◽

Shozo Ino

Keyword(s):

Electron Diffraction ◽

High Energy ◽

Total Reflection ◽

Energy Electron ◽

High Energy Electron ◽

X Ray ◽

Study of Epitaxy by RHEED(Reflection High Energy Electron Diffraction)-TRAXS(Total Reflection Angle X-Ray Spectroscopy).

Analytical Sciences ◽

10.2116/analsci.11.539 ◽

1995 ◽

Vol 11 (3) ◽

pp. 539-543 ◽

Cited By ~ 2

Author(s):

Shozo INO

Keyword(s):

Electron Diffraction ◽

High Energy ◽

Total Reflection ◽

Energy Electron ◽

High Energy Electron ◽

X Ray ◽

Superstructures Induced by Ni Adsorption on a Clean Si(110) Surface Studied by Reflection High-Energy Electron Diffraction-Total Reflection Angle X-Ray Spectroscopy

10.1143/jjap.31.2544 ◽

1992 ◽

Vol 31 (Part 1, No. 8) ◽

pp. 2544-2549 ◽

Cited By ~ 9

Author(s):

Youiti Yamamoto

Keyword(s):

Electron Diffraction ◽

High Energy ◽

Total Reflection ◽

Energy Electron ◽

High Energy Electron ◽

X Ray ◽

In situ observation of the growth process of the InAsGaAs heteroepitaxial system using scanning microprobe reflection high energy electron diffraction-total reflection angle X-ray spectroscopy

Thin Solid Films ◽

10.1016/0040-6090(93)90554-3 ◽

1993 ◽

Vol 228 (1-2) ◽

pp. 18-22 ◽

Cited By ~ 2

Author(s):

S. Shimizu ◽

K. Yamamuro ◽

K. Fuwa ◽

H. Yanagida ◽

H. Yamakawa ◽

...

Keyword(s):

Electron Diffraction ◽

Growth Process ◽

High Energy ◽

Total Reflection ◽

Energy Electron ◽

In Situ Observation ◽

High Energy Electron ◽

X Ray ◽

Direct observation of GaAs atomic layer epitaxy by reflection high‐energy electron diffraction

Applied Physics Letters ◽

10.1063/1.101666 ◽

1989 ◽

Vol 55 (12) ◽

pp. 1244-1246 ◽

Cited By ~ 33

Author(s):

T. H. Chiu

Keyword(s):

Electron Diffraction ◽

Direct Observation ◽

Atomic Layer ◽

High Energy ◽

Energy Electron ◽

Atomic Layer Epitaxy ◽

High Energy Electron

Observation of different reflected high-energy electron diffraction patterns during atomic layer epitaxy growth of CdTe epilayers

Journal of Crystal Growth ◽

10.1016/0022-0248(91)90829-t ◽

1991 ◽

Vol 115 (1-4) ◽

pp. 692-697 ◽

Cited By ~ 18

Author(s):

W. Faschinger ◽

P. Juza ◽

H. Sitter

Keyword(s):

Electron Diffraction ◽

Atomic Layer ◽

High Energy ◽

Energy Electron ◽

Atomic Layer Epitaxy ◽

High Energy Electron ◽

Diffraction Patterns

Study of a Si(110) surface by using reflection high-energy electron diffraction-total reflection angle X-ray spectroscopy and high temperature scanning tunneling microscopy

Surface Science ◽

10.1016/0039-6028(94)91163-0 ◽

1994 ◽

Vol 313 (1-2) ◽

pp. 155-167 ◽

Cited By ~ 41

Author(s):

Youiti Yamamoto

Keyword(s):

High Temperature ◽

Electron Diffraction ◽

High Energy ◽

Total Reflection ◽

Scanning Tunneling ◽

High Energy Electron ◽

Tunneling Microscopy ◽

X Ray ◽

Reflection Angle ◽

Temperature Scanning