Glancing Angle Dependence of the X-Ray Emission Measured under Total Reflection Angle X-Ray Spectroscopy (TRAXS) Condition during Reflection High Energy Electron Diffraction Observation

1992 ◽  
Vol 31 (Part 2, No. 10B) ◽  
pp. L1503-L1505 ◽  
Author(s):  
Toshiro Yamanaka ◽  
Takashi Hanada ◽  
Shozo Ino ◽  
Hiroshi Daimon
Keyword(s):  
Electron Diffraction ◽  
High Energy ◽  
Total Reflection ◽  
Energy Electron ◽  
High Energy Electron ◽  
X Ray ◽  
Angle Dependence ◽  
Reflection Angle ◽  
Glancing Angle

ELECTRON STANDING WAVES AT A SURFACE DURING REFLECTION HIGH ENERGY ELECTRON DIFFRACTION AND APPLICATION TO STRUCTURE ANALYSIS

2000 ◽  
Vol 14 (21) ◽  
pp. 2171-2222
Author(s):  
TOSHIRO YAMANAKA ◽  
SHOZO INO
Keyword(s):  
Electron Diffraction ◽  
Structure Analysis ◽  
Standing Waves ◽  
High Energy ◽  
Energy Electron ◽  
High Energy Electron ◽  
Surface Electron ◽  
X Ray ◽  
Wave Resonance ◽  
Glancing Angle

During observation of reflection high energy electron diffraction (RHEED), the interference between the incident and diffracted beams leads to the formation of surface electron standing waves. Characteristic X-ray emission is strongly excited if the atom exists in a strong wave field. Therefore, X-ray yields depends on the position of the atom and incident glancing angle (θg) of the electron beam, since the distribution of these waves changes with θg. Such anomalous intensities of X-ray emission are clearly observed under both Bragg and surface wave resonance conditions. By using these intensities, the height and adsorption site of surface adatoms can be analyzed. In this review, surface electron channeling and its application to surface structure analysis are discussed.

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