Difference in Diffusion Length of Ga Atoms underAs2andAs4Flux in Molecular Beam Epitaxy

1997 ◽  
Vol 36 (Part 1, No. 9A) ◽  
pp. 5670-5673 ◽  
Author(s):  
Takeyoshi Sugaya ◽  
Tadashi Nakagawa ◽  
Yoshinobu Sugiyama ◽  
Yasuhiko Tanuma ◽  
Kenji Yonei
1994 ◽  
Vol 64 (9) ◽  
pp. 1123-1125 ◽  
Author(s):  
Y. Nomura ◽  
Y. Morishita ◽  
S. Goto ◽  
Y. Katayama ◽  
T. Isu

2019 ◽  
Vol 692 ◽  
pp. 137586
Author(s):  
Yuanchang Zhang ◽  
Kurt G. Eyink ◽  
Madelyn Hill ◽  
Brittany Urwin ◽  
Krishnamurthy Mahalingam

1992 ◽  
Vol 61 (10) ◽  
pp. 1196-1198 ◽  
Author(s):  
S. H. Shin ◽  
J. M. Arias ◽  
M. Zandian ◽  
J. G. Pasko ◽  
J. Bajaj ◽  
...  

2019 ◽  
Vol 512 ◽  
pp. 37-40 ◽  
Author(s):  
Jose A. Piedra-Lorenzana ◽  
Keisuke Yamane ◽  
Koki Shiota ◽  
Junya Fujimoto ◽  
Shunsuke Tanaka ◽  
...  

1992 ◽  
Vol 263 ◽  
Author(s):  
William M. Tong ◽  
Eric J. Snyder ◽  
R. Stanley Williams ◽  
Akihisa Yanase ◽  
Yusaburo Segawa ◽  
...  

ABSTRACTThe growth of CuCl/CaF2 heterostructures has been studied with an atomic force microscope (AFM). We have grown by molecular beam epitaxy (MBE) CuCl thin films at various substrate temperatures and thicknesses on CaF2(111) substrates. AFM studies reveal that islanding is the dominant growth mechanism. We calculated the height-height correlation function, 〈lh(qt)|2〉, for each of our films and compared them to the predictions made by the Shadowing Growth Theory, a preexisting growth model that enabled us to extract the important kinetic parameter of surface diffusion length for the growth condition of each of the four films.


2009 ◽  
Vol 2009 ◽  
pp. 1-7 ◽  
Author(s):  
Lorenzo Rigutti ◽  
Andres De Luna Bugallo ◽  
Maria Tchernycheva ◽  
Gwenole Jacopin ◽  
François H. Julien ◽  
...  

We report on the growth, structural characterization, and conductivity studies of Si-doped InP nanowires grown by Au-assisted molecular beam epitaxy. It is shown that Si doping reduces the mean diffusion length of adatoms on the lateral nanowire surface and consequently reduces the nanowire growth rate and promotes lateral growth. A resistivity as low as5.1±0.3×10−5 Ω⋅cm is measured for highly doped nanowires. Two dopant incorporation mechanisms are discussed: incorporation via catalyst particle and direct incorporation on the nanowire sidewalls. The first mechanism is shown to be less efficient than the second one, resulting in inhomogeneous radial dopant distribution.


2015 ◽  
Vol 12 (4-5) ◽  
pp. 447-450 ◽  
Author(s):  
Timur Malin ◽  
Alexander Gilinsky ◽  
Vladimir Mansurov ◽  
Dmitriy Protasov ◽  
Eugeny Yakimov ◽  
...  

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