Strain-Field Evaluation of Strain-Relaxed Thin SiGe Layers Fabricated by Ion Implantation Method
2005 ◽
Vol 44
(No. 43)
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pp. L1316-L1319
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2018 ◽
Vol 28
(3)
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pp. 847-853
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Keyword(s):
1998 ◽
Vol 54
(1-3)
◽
pp. 301-304
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