scholarly journals Demonstrating Applications of Non-optically Regulated Tapping-Mode Near-Field Scanning Optical Microscopy to Nano-optical Metrology and Optical Characterization of Semiconductors

2006 ◽  
Vol 45 (3B) ◽  
pp. 2187-2192 ◽  
Author(s):  
Nien Hua Lu ◽  
Shuen De Chang ◽  
Guan-Bin Huang ◽  
Hung Ji Huang ◽  
Ying Sheng Huang ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Optical Characterization ◽  
Optical Metrology ◽  
Tapping Mode ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

scholarly journals Characterization of power induced heating and damage in fiber optic probes for near-field scanning optical microscopy

2007 ◽  
Vol 78 (5) ◽  
pp. 053712 ◽  
Author(s):  
Nicholas E. Dickenson ◽  
Elizabeth S. Erickson ◽  
Olivia L. Mooren ◽  
Robert C. Dunn
Keyword(s):  
Optical Microscopy ◽  
Fiber Optic ◽  
Near Field ◽  
Fiber Optic Probes ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Characterization of a 90° waveguide bend using near-field scanning optical microscopy

2005 ◽  
Vol 87 (19) ◽  
pp. 191107 ◽  
Author(s):  
Guangwei Yuan ◽  
Kevin L. Lear ◽  
Matthew D. Stephens ◽  
David S. Dandy
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning ◽  
Waveguide Bend
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