Local Characterization of Photonic Structures by Near-field Scanning Optical Microscopy and Spectral Interferometry

Local Characterization ◽

Combining near-field scanning optical microscopy with spectral interferometry for local characterization of the optical electric field in photonic structures

Optics Express ◽

10.1364/oe.21.016629 ◽

2013 ◽

Vol 21 (14) ◽

pp. 16629 ◽

Cited By ~ 3

Author(s):

Johanna Trägårdh ◽

Henkjan Gersen

Keyword(s):

Electric Field ◽

Optical Microscopy ◽

Near Field ◽

Spectral Interferometry ◽

Photonic Structures ◽

Local Characterization ◽

Characterization of the self-assembled InP structure grown on the GaInP epitaxial layer mismatched to GaAs substrate by near-field scanning optical microscopy (NSOM)

10.1117/12.532752 ◽

2004 ◽

Author(s):

Hao Wang ◽

Changjun Liao ◽

Guanghan Fan ◽

Song-Hao Liu ◽

Yangzhe Wu ◽

...

Keyword(s):

Optical Microscopy ◽

Epitaxial Layer ◽

Gaas Substrate ◽

Near Field ◽

The Self ◽

Self Assembled ◽

Characterization of power induced heating and damage in fiber optic probes for near-field scanning optical microscopy

Review of Scientific Instruments ◽

10.1063/1.2740133 ◽

2007 ◽

Vol 78 (5) ◽

pp. 053712 ◽

Cited By ~ 11

Author(s):

Nicholas E. Dickenson ◽

Elizabeth S. Erickson ◽

Olivia L. Mooren ◽

Robert C. Dunn

Keyword(s):

Optical Microscopy ◽

Fiber Optic ◽

Near Field ◽

Fiber Optic Probes ◽

2006 Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference ◽

Characterization of a 90° waveguide bend using near-field scanning optical microscopy

10.1109/cleo.2006.4627942 ◽

2006 ◽

Author(s):

Guangwei Yuan ◽

Matthew D. Stephens ◽

David S. Dandy ◽

Kevin L. Lear

Keyword(s):

Optical Microscopy ◽

Near Field ◽

Near Field Scanning ◽

Waveguide Bend

Characterization of a 90° waveguide bend using near-field scanning optical microscopy

Applied Physics Letters ◽

10.1063/1.2126135 ◽

2005 ◽

Vol 87 (19) ◽

pp. 191107 ◽

Cited By ~ 6

Author(s):

Guangwei Yuan ◽

Kevin L. Lear ◽

Matthew D. Stephens ◽

David S. Dandy

Keyword(s):

Optical Microscopy ◽

Near Field ◽

Near Field Scanning ◽

Waveguide Bend

Simultaneous characterization of coated paper topography and optical contrast by near-field scanning optical microscopy (NSOM)

Nordic Pulp & Paper Research Journal ◽

10.3183/npprj-2008-23-04-p438-443 ◽

2008 ◽

Vol 23 (4) ◽

pp. 438-443

Author(s):

Deqiang Ma ◽

R. Douglas Carter ◽

David Haefner ◽

Aristide Dogariu

Keyword(s):

Optical Microscopy ◽

Near Field ◽

Optical Contrast ◽

Coated Paper ◽

Characterization of optical fibers using near‐field scanning optical microscopy

Journal of Applied Physics ◽

10.1063/1.356212 ◽

1994 ◽

Vol 75 (6) ◽

pp. 2753-2756 ◽

Cited By ~ 19

Author(s):

D. J. Butler ◽

K. A. Nugent ◽

A. Roberts

Keyword(s):

Optical Microscopy ◽

Optical Fibers ◽

Near Field ◽

Characterization of VCSEL modal output using near-field scanning optical microscopy

10.1117/12.469220 ◽

2002 ◽

Cited By ~ 1

Author(s):

William C. Bradford ◽

Joseph D. Beach ◽

Reuben T. Collins ◽

David Galt ◽

David W. Kisker

Keyword(s):

Optical Microscopy ◽

Near Field ◽

Demonstrating Applications of Non-optically Regulated Tapping-Mode Near-Field Scanning Optical Microscopy to Nano-optical Metrology and Optical Characterization of Semiconductors

Japanese Journal of Applied Physics ◽

10.1143/jjap.45.2187 ◽

2006 ◽

Vol 45 (3B) ◽

pp. 2187-2192 ◽

Cited By ~ 1

Author(s):

Nien Hua Lu ◽

Shuen De Chang ◽

Guan-Bin Huang ◽

Hung Ji Huang ◽

Ying Sheng Huang ◽

...

Keyword(s):

Optical Microscopy ◽

Near Field ◽

Optical Characterization ◽

Optical Metrology ◽

Tapping Mode ◽

Near-field scanning optical microscopy and time-resolved optical characterization of epitaxial lateral overgrown c-plane and a-plane GaN

Applied Physics Letters ◽

10.1063/1.2424677 ◽

2006 ◽

Vol 89 (26) ◽

pp. 262117 ◽

Cited By ~ 9

Author(s):

Ü. Özgür ◽

X. Ni ◽

Y. Fu ◽

H. Morkoç ◽

H. O. Everitt

Keyword(s):

Optical Microscopy ◽

Near Field ◽

Optical Characterization ◽

Time Resolved ◽