Compact Hot-Electron Induced Oxide Trapping Charge and Post-Stress Drain Current Modeling for Buried-Channel p-Type Metal–Oxide–Semiconductor Field-Effect-Transistors
2008 ◽
Vol 47
(8)
◽
pp. 6200-6204
◽
Keyword(s):
P Type
◽
Keyword(s):
2002 ◽
Vol 41
(Part 1, No. 1)
◽
pp. 54-58
◽
Keyword(s):
Keyword(s):
2010 ◽
Vol 157
(6)
◽
pp. H633
◽
Keyword(s):
1999 ◽
Vol 38
(Part 1, No. 8)
◽
pp. 4696-4698
◽
Keyword(s):
Keyword(s):