Monochromatization of Collimated Coherent Bremsstrahlung from a Thin Silicon Crystal

1971 ◽  
Vol 30 (3) ◽  
pp. 806-810 ◽  
Author(s):  
Tetsuji Nishikawa ◽  
Shiro Suzuki ◽  
Tsuneaki Tsuru ◽  
Kuninori Endo ◽  
Takeshi Katayama ◽  
...  
Keyword(s):  
Silicon Crystal ◽  
Coherent Bremsstrahlung ◽  
Thin Silicon

Electron emission induced by fast heavy ions in a thin silicon crystal

2004 ◽  
Vol 70 (3) ◽  
Author(s):  
F. Barrué ◽  
M. Chevallier ◽  
D. Dauvergne ◽  
R. Kirsch ◽  
J.-C. Poizat ◽  
...  
Keyword(s):  
Electron Emission ◽  
Heavy Ions ◽  
Silicon Crystal ◽  
Thin Silicon

scholarly journals Further tests on liquid‐nitrogen‐cooled, thin silicon‐crystal monochromators using a focused wiggler synchrotron beam

1996 ◽  
Vol 67 (9) ◽  
pp. 3350-3350 ◽  
Author(s):  
C. S. Rogers ◽  
D. M. Mills ◽  
P. B. Fernandez ◽  
G. S. Knapp ◽  
M. Wulff ◽  
...  
Keyword(s):  
Liquid Nitrogen ◽  
Silicon Crystal ◽  
Synchrotron Beam ◽  
Thin Silicon

scholarly journals Experimental results with cryogenically cooled thin silicon crystal x-ray monochromators on high heat flux beamlines

1996 ◽  
Author(s):  
Carey S. Rogers ◽  
Dennis M. Mills ◽  
Wah Keat Lee ◽  
Patricia B. Fernandez ◽  
Timothy Graber
Keyword(s):  
Heat Flux ◽  
Silicon Crystal ◽  
High Heat ◽  
Experimental Results ◽  
High Heat Flux ◽  
X Ray ◽  
Thin Silicon

The energy dependence of axial coherent bremsstrahlung in the high-voltage electron microscope

1987 ◽  
Vol 45 ◽  
pp. 110-111
Author(s):  
J.H. Butler ◽  
J.C.H. Spence ◽  
C.J. Humphreys ◽  
E.A. Johnson
Keyword(s):  
Electron Microscope ◽  
High Voltage ◽  
Strong Dependence ◽  
Reciprocal Lattice ◽  
Silicon Crystal ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
High Voltage Electron ◽  
Peak Energy ◽  
Coherent Bremsstrahlung

Coherent bremsstrahlung (CB) emitted by 200 to 1000 keV electrons traversing oriented silicon crystal targets has been detected using a high voltage electron microscope equipped with an energy dispersive x-ray spectrometer. In this energy range there 1s a strong dependence on the relativistic properties of the Incident electrons: β = v/c varies from about 0.69 (E = 200 keV) to 0.94 (E = 1 MeV); whereas in higher energy accelerator CB experiments β remains close to unity and the variation of any particular peak energy with respect to E is small.This work concentrates on the detection of the “type B” CB which arises from “juddering” of the electron beam as it traverses successive planes of atoms and is prominent 1n directions transverse to the beam. These spectra exhibit harmonics, peak energies which are Integral multiples of a basic value, which can be ascribed to Umklapp processes in successively higher order Laue zones (H0LZ) of the reciprocal lattice.

Variation of Bragg-Case Diffraction Curves of X-Rays from a Thin Silicon Crystal with Crystal Thickness

1970 ◽  
Vol 29 (3) ◽  
pp. 806-806 ◽  
Author(s):  
Hiroo Hashizume ◽  
Kan Nakayama ◽  
Tadashi Matsushita ◽  
Kazutake Kohra
Keyword(s):  
Silicon Crystal ◽  
Crystal Thickness ◽  
X Rays ◽  
Thin Silicon

Performance of a liquid‐nitrogen‐cooled, thin silicon crystal monochromator on a high‐power, focused wiggler synchrotron beam

1995 ◽  
Vol 66 (6) ◽  
pp. 3494-3499 ◽  
Author(s):  
C. S. Rogers ◽  
D. M. Mills ◽  
W.‐K. Lee ◽  
G. S. Knapp ◽  
J. Holmberg ◽  
...  
Keyword(s):  
Liquid Nitrogen ◽  
High Power ◽  
Silicon Crystal ◽  
Synchrotron Beam ◽  
Thin Silicon
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