Formation and Characterization of Organic Monolayers on Semiconductor Surfaces

2008 ◽  
Vol 1 (1) ◽  
pp. 707-736 ◽  
Author(s):  
Robert J. Hamers
Keyword(s):  
Semiconductor Surfaces ◽  
Organic Monolayers

Contactless electromodulation for the characterization of semiconductor surfaces/interfaces

1994 ◽  
pp. 307-314
Author(s):  
Fred H. Pollak ◽  
H. Qiang ◽  
D. Yan ◽  
Yichun Yin ◽  
J.M. Woodall
Keyword(s):  
Semiconductor Surfaces

Truly Quantitative XPS Characterization of Organic Monolayers on Silicon: Study of Alkyl and Alkoxy Monolayers on H−Si(111)

2005 ◽  
Vol 127 (21) ◽  
pp. 7871-7878 ◽  
Author(s):  
Xavier Wallart ◽  
Catherine Henry de Villeneuve ◽  
Philippe Allongue
Keyword(s):  
Organic Monolayers ◽  
Xps Characterization

Characterization of silicon-oxide interfaces and organic monolayers by IR-UV ellipsometry and FTIR spectroscopy

2006 ◽  
Author(s):  
P. Hess ◽  
P. Patzner ◽  
A. V. Osipov ◽  
Z. G. Hu ◽  
D. Lingenfelser ◽  
...  
Keyword(s):  
Ftir Spectroscopy ◽  
Silicon Oxide ◽  
Organic Monolayers ◽  
Oxide Interfaces

scholarly journals Static and dynamic electronic characterization of organic monolayers grafted on a silicon surface

2016 ◽  
Vol 18 (5) ◽  
pp. 3675-3684 ◽  
Author(s):  
O. Pluchery ◽  
Y. Zhang ◽  
R. Benbalagh ◽  
L. Caillard ◽  
J. J. Gallet ◽  
...  
Keyword(s):  
Silicon Surface ◽  
Organic Monolayers ◽  
Inorganic Hybrid ◽  
Organic Layers ◽  
Nanoelectronic Devices ◽  
The Way

Organic layers chemically grafted on silicon offer excellent interfaces that may open up the way for new organic–inorganic hybrid nanoelectronic devices.

Structural characterization of organic monolayers on Si〈111〉 from capacitance measurements

2000 ◽  
Vol 45 (20) ◽  
pp. 3241-3248 ◽  
Author(s):  
Philippe Allongue ◽  
Catherine Henry de Villeneuve ◽  
Jean Pinson
Keyword(s):  
Structural Characterization ◽  
Organic Monolayers ◽  
Capacitance Measurements
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