SnO2 ( Sb )  Electrodes: Morphological Changes Due to Polarizations in the HER and OER Potential Regions Studied by In Situ STM and Ex Situ AFM Imaging

1999 ◽  
Vol 146 (6) ◽  
pp. 2169-2174 ◽  
Author(s):  
C. Longo ◽  
G. Abadal ◽  
F. Sanz ◽  
P. T. A. Sumodjo
1996 ◽  
Vol 369 (1-3) ◽  
pp. 321-335 ◽  
Author(s):  
Taro Yamada ◽  
Katsuhiko Ogaki ◽  
Shinya Okubo ◽  
Kingo Itaya

2010 ◽  
Vol 12 (16) ◽  
pp. 4184 ◽  
Author(s):  
Mitsuru Wakisaka ◽  
Shuichi Asizawa ◽  
Hiroyuki Uchida ◽  
Masahiro Watanabe

2009 ◽  
Vol 113 (31) ◽  
pp. 13758-13764 ◽  
Author(s):  
Shuehlin Yau ◽  
YiHui Lee ◽  
ChinZen Chang ◽  
LiangJen Fan ◽  
YawWen Yang ◽  
...  
Keyword(s):  
Ex Situ ◽  

2007 ◽  
Vol 1035 ◽  
Author(s):  
Markus Valtiner ◽  
Guido Grundmeier

AbstractPolar ZnO(0001)-Zn surfaces can be prepared as very well defined and single crystalline surfaces by hydroxide stabilization simply by introducing hydroxides via a wet chemical cleaning step. Within this proceeding we present an in-situ AFM imaging of the crystallization process. The pH dependent stability of the resulting hydroxide-stabilized surfaces was further investigated by means of an ex-situ LEED approach. These investigations show, that it is possible to obtain high quality single crystalline ZnO(0001)-Zn surfaces in a simple way. Moreover, these surfaces turned out to be very stable within a wide range of pH values between 11 and 3 of NaClO4 based 1mM electrolyte solutions.


2009 ◽  
Vol 131 (18) ◽  
pp. 6468-6474 ◽  
Author(s):  
YiHui Lee ◽  
ChinZen Chang ◽  
ShuehLin Yau ◽  
LiangJen Fan ◽  
YawWen Yang ◽  
...  
Keyword(s):  
Ex Situ ◽  

1998 ◽  
Vol 102 (18) ◽  
pp. 3498-3505 ◽  
Author(s):  
J. Inukai ◽  
Y. Osawa ◽  
M. Wakisaka ◽  
K. Sashikata ◽  
Y.-G. Kim ◽  
...  

Author(s):  
A. V. Zagrebelny ◽  
E. T. Lilleodden ◽  
J. C. Nelson ◽  
S. Ramamurthy ◽  
C. B. Carter

Contact which only involves a small volume of material is becoming increasingly important to many industries including micromachines, microelectronics, and magnetic recording. The ability to characterize surface roughening on the micro- and nanoscopic scale is invaluable in understanding microplasticity due to indentation, scratches, wear, fatigue and epitactic mismatch. It has been demonstrated that AFM studies are appropriate for developing a mechanistic approach to μN load indentation analysis since they allow deformation volumes and residual depths to be measured and characterized directly and unambiguously.In the present study, interfaces between silicate glass and single-crystal α-Al2O3 have been studied using AFM and nanoindentation. The interfaces between the glass and the crystalline grains were prepared by growing films of anorthite (CaAl2Si2O8) composition with thickness ranging 100-200 nm on single-crystal sapphire substrates of {1120} (A-plane) and {1102} (R-plane) crystallographic orientations by pulsed-laser deposition (PLD). Some specimens were subjected to heat treatments in a conventional box furnace causing films to dewet the substrates. Fig. 1 shows schematically the morphology of the dewetted film which has resulted in the formation of distinctive islands, 0.5-2 μm in size. Both types of specimens were tested with two different micro/nanomechanical testers.


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