Quantitative Study of Charge‐to‐Breakdown of Thin Gate Oxide for a p+‐Poly‐Si Metal Oxide Semiconductor Capacitor
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2011 ◽
Vol 94
(4)
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pp. 1005-1007
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1998 ◽
Vol 37
(Part 2, No. 1A/B)
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pp. L1-L3
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2007 ◽
Vol 51
(4)
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pp. 627-632
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