Impact of the gate-electrode/dielectric interface on the low-frequency noise of thin gate oxide n-channel metal-oxide-semiconductor field-effect transistors
2007 ◽
Vol 51
(4)
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pp. 627-632
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2000 ◽
Vol 40
(11)
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pp. 1897-1903
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2010 ◽
Vol 49
(8)
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pp. 084201
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2001 ◽
Vol 40
(Part 1, No. 9A)
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pp. 5290-5293
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2011 ◽
Vol 50
(4)
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pp. 04DC01
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2011 ◽
Vol 50
(10S)
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pp. 10PB03
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2011 ◽
Vol 50
(10S)
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pp. 10PB02
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2002 ◽
Vol 149
(1)
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pp. 23-31
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