Reliable Bottom Gate Amorphous Indium–Gallium–Zinc Oxide Thin-Film Transistors with TiO[sub x] Passivation Layer
2009 ◽
Vol 12
(9)
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pp. H348
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Keyword(s):
2017 ◽
Vol 9
(15)
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pp. 13278-13285
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2013 ◽
Vol 9
(9)
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pp. 699-703
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2010 ◽
Keyword(s):
2009 ◽
Keyword(s):
2015 ◽
Vol 135
(6)
◽
pp. 192-198
◽
Keyword(s):
Keyword(s):
Keyword(s):