Formation of Dendrite-Like Defect during PR-Mask Silicon Oxide Wet Etching Process and Its Removal Method

2013 ◽  
Vol 2 (11) ◽  
pp. P97-P100
Author(s):  
M.-G. Song ◽  
B. U. Yoon ◽  
K.-T. Lee ◽  
S.-Y. Choi
2014 ◽  
Vol 660 ◽  
pp. 894-898
Author(s):  
Rosminazuin A. Rahim ◽  
Badariah Bais ◽  
Majlis Burhanuddin Yeop

In this paper, a simple microcantilever release process using anisotropic wet etching is presented. The microcantilever release is conducted at the final stage of the fabrication of piezoresistive microcantilever sensor. Issues related to microcantilever release such as microscopic roughness and macroscopic roughness has been resolved using simple technique. By utilizing silicon oxide (SiO2) as the etch stop for the wet etching process, issues related to microscopic roughness can be eliminated. On the other hand, proper etching procedure with constant stirring of the etchant solution of KOH anisotropic etching significantly reduces the notching effect contributed by the macroscopic roughness. Upon the completion of microcantilever release, suspended microcantilever of 2μm thick is realized with the removal of SiO2layer using Buffered Oxide Etching (BOE).


2013 ◽  
Vol 58 (6) ◽  
pp. 57-61
Author(s):  
K. Ko ◽  
H. Jeon ◽  
M. Song ◽  
J. Han ◽  
B. Yoon ◽  
...  
Keyword(s):  

2010 ◽  
Vol 518 (8) ◽  
pp. 2147-2151
Author(s):  
Abderrafia Moujoud ◽  
Sungho Kang ◽  
Hyun Jae Kim ◽  
Mark Andrews

2004 ◽  
Vol 68 (1) ◽  
pp. 221-228
Author(s):  
YOSHIOMI HIRANAGA ◽  
YASUO WAGATSUMA ◽  
YASUO CHO

2004 ◽  
Author(s):  
Min Xiang ◽  
Yanmin Cai ◽  
Yaming Wu ◽  
Jianyi Yang ◽  
Yuelin Wang

1997 ◽  
Vol 36 (Part 1, No. 6A) ◽  
pp. 3576-3579
Author(s):  
Yu Ho Jung ◽  
Byeong Kwon Ju ◽  
Jae Hoon Jung ◽  
Yun Hi Lee ◽  
Myung Hwan Oh ◽  
...  

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